Equipment inspection abnormal information processing method and device and electronic equipment
A technology of abnormal information and processing method, which is applied to the processing method of equipment inspection abnormal information, devices and electronic equipment, which can solve problems that cannot be solved quickly and achieve the effect of ensuring normal operation
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[0020] The implementation of the present invention will be illustrated by specific specific examples below, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.
[0021] In the following description, for purposes of illustration rather than limitation, specific details, such as specific system architectures, interfaces, and techniques, are set forth in order to provide a thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
[0022] In the description of the present invention, it should be noted that unless otherwise specified and limited, the terms "conne...
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