Electrical impedance imaging method and device based on supervised descent method
An electrical impedance imaging and electrical impedance technology, applied in medical science, sensors, diagnostic recording/measurement, etc., can solve the problems of slow image reconstruction, large amount of calculation, limited image reconstruction speed, etc., and achieve fast and good image reconstruction speed. The effect of noise immunity
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[0025] The drawings are for illustration only and should not be construed as limiting the invention. The technical solutions of the present invention will be further described below in conjunction with the accompanying drawings and embodiments.
[0026] Suppose the forward model of electrical impedance imaging (EIT) is s(σ), where σ is the conductivity distribution in the area to be imaged. The forward model reflects simulated boundary measurement data for a given excitation and conductivity distribution. Suppose the measured data of EIT is d. The EIT image reconstruction problem can be expressed as minimizing the following objective function:
[0027] C(σ)=||s(σ)-d|| 2 (1)
[0028] At the kth step of the iteration, we know the conductivity model σ of the k-1th step k-1 . The unknown conductivity distribution can be expressed as σ = σ k-1 +Δσ k . That is, introducing the difference Δσ k . Then the objective function (1) becomes:
[0029] C(σ k-1 +Δσ k )=||s(σ k...
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