Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Line loss rate key factor determination method and device based on random matrix theory

A technology of key factors and determination methods, applied in data processing applications, instruments, complex mathematical operations, etc., can solve problems such as abnormal judgment of line loss in unfavorable station areas and the development of governance work

Inactive Publication Date: 2020-04-28
STATE GRID JIANGSU ELECTRIC POWER CO ELECTRIC POWER RES INST +4
View PDF2 Cites 2 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, domestic and foreign researches on the line loss management of the station area still mainly focus on the calculation of the line loss rate of the station area, and the analysis of the key factors affecting the line loss rate of the low-voltage station area is seldom carried out, which is not conducive to the abnormal judgment and management of the line loss of the station area carry out

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Line loss rate key factor determination method and device based on random matrix theory
  • Line loss rate key factor determination method and device based on random matrix theory
  • Line loss rate key factor determination method and device based on random matrix theory

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0074] refer to figure 1 As shown, this embodiment is a method for determining key factors of line loss rate, including:

[0075] Collect the line loss rate and its influencing factor index data of multiple station areas;

[0076] For each influencing factor index, construct the first random matrix as the experimental matrix based on the corresponding index data, line loss rate data and random quantity, and construct the second random matrix as the comparison matrix based on the line loss rate data and random quantity;

[0077] Use the preset sampling window to sample the experimental matrix and the comparison matrix multiple times synchronously, and calculate the average spectral radius of the matrix obtained by each sampling;

[0078] Based on the average spectral radius corresponding to each sampling, calculate the variation curve of the difference between the average spectral radius of the experimental matrix and the comparison matrix with the sampling time;

[0079] Bas...

Embodiment 1-1

[0083] Based on embodiment 1, this embodiment is based on n 1 As an example, analyze the key factors of the line loss rate in a station area to be analyzed, such as figure 1 As shown, the flow of the method for determining the key factors of the line loss rate in this embodiment is as follows.

[0084] 1) Collect n 1 The line loss rate of a station area and its n 2 Influencing factor index data;

[0085] 2) Preprocessing the collected data, including: eliminating abnormal data and supplementing missing data, so as to avoid calculation deviation caused by missing or abnormal data sampling points;

[0086] 3) For each influencing factor index, construct a first random matrix as an experimental matrix based on corresponding index data, line loss rate data and random quantities, and construct a second random matrix as a comparison matrix based on line loss rate data and random quantities;

[0087] Assume that step 1) synchronously collect the line loss rate and its influencing...

Embodiment 2

[0134] Based on the same inventive concept as Embodiment 1, this embodiment is a device for determining key factors of line loss rate, including:

[0135] The data collection module is used to collect the line loss rate and its influencing factor index data of multiple stations;

[0136] The data preprocessing module is used to preprocess the collected data. The preprocessing includes: eliminating abnormal data and supplementing missing data;

[0137] The matrix construction module is used to construct an experimental matrix based on the preprocessed line loss rate data and corresponding index data for each influencing factor index, and construct a comparison matrix based on the preprocessed line loss rate data;

[0138] The matrix average spectral radius calculation module is used to use the preset sampling window to carry out multiple synchronous sampling of the experimental matrix and the comparison matrix, and calculate the average spectral radius of the matrix obtained by...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a line loss rate key factor determination method and device based on a random matrix theory. The method comprises the steps of collecting line loss rates of a plurality of transformer areas and influence factor index data of the line loss rates; aiming at each influence factor index, respectively constructing an experiment matrix and a comparison matrix; synchronously sampling the experimental matrix and the contrast matrix by using a sampling window, and calculating the average spectral radius of the matrix obtained by sampling each time; calculating a change curve ofthe difference between the average spectral radiuses of the experimental matrix and the contrast matrix along with the sampling moment; calculating the correlation degree between the influence factorindexes and the line loss rate; and extracting influence factor indexes with relatively high correlation degree as key factors of the line loss rate. According to the method, the line loss rate key influence factors of the low-voltage transformer area can be determined, and a reliable data basis is provided for line loss management of each low-voltage transformer area and transformer area equipment construction.

Description

technical field [0001] The invention relates to the technical field of line loss management, in particular to a method and device for determining key factors of line loss rate based on random matrix theory. Background technique [0002] The electric energy produced by the power plant in the power system is supplied to the user through the transmission, transformation and power supply links of the power grid. In the process of transmitting and distributing electrical energy, each component in the power grid (such as transformers, transmission lines and protection devices, etc.) consumes a certain amount of electrical energy. [0003] A low-voltage station area refers to the power supply range or area of ​​a distribution transformer. The scope of line loss calculation in the low-voltage station area starts from the watt-hour meter installed at the outlet of the distribution transformer in the station area to the watt-hour meter of each user. Within this range, all forms of p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06Q10/06G06Q50/06G06F17/16
CPCG06Q10/0639G06Q50/06G06F17/16
Inventor 吴伟将周玉杨世海陆婋泉楚成博易永仙程含渺崔高颖刘玲陈文婧孙国强
Owner STATE GRID JIANGSU ELECTRIC POWER CO ELECTRIC POWER RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com