A kind of ATP peripheral equipment simulation method and universal simulator for testing ATP equipment

Abstract

The invention provides an ATP peripheral equipment simulation method for testing ATP equipment. The method comprises the steps: enabling a universal simulator to obtain a simulation request, and determining ATP peripheral equipment needing to be simulated according to the simulation request; calling a test script with a trigger judgment condition according to the ATP peripheral equipment requiredto be simulated; and executing the test script with the trigger judgment condition, simulating ATP peripheral equipment, and sending data to the ATP equipment by the general simulator to test the ATPequipment. According to the invention, analogue simulation of different ATP peripheral devices is realized, and the simulated ATP peripheral devices are used for testing the ATP device. The ATP equipment test is strict and comprehensive, and the test of a special scene can also be realized. And the used general simulator is simple to upgrade, easy to maintain and low in test cost.

Description

technical field [0001] The invention belongs to the field of ATP peripheral equipment simulation, in particular to an ATP peripheral equipment simulation method and a general simulator for testing ATP equipment. Background technique [0002] As the core equipment of the train operation control system, ATP equipment realizes overspeed protection and aggressive protection, and ensures the safe operation of trains. It is particularly important to conduct strict and comprehensive testing and verification of ATP equipment. There are many methods for testing ATP equipment, and there is a half-physical and half-simulation test method. This test method requires the support of many real devices, which is expensive, difficult to maintain, and cannot realize the test of special scenarios. There is also a PC-based test method. This test method uses software to implement peripheral device logic. Compared with the half-physical and half-simulation test method, it has many advantages. Howe...

AI Technical Summary

Problems solved by technology

There are many methods for testing ATP equipment, and there is a half-physical and half-simulation test method. This test method requires the support of many real devices, which is expensive, difficult to maintain, and cannot realize the test of special scenarios.

There is also a PC-based test method, which uses software to implement the peripheral device logic, which has many advantages compared to the half-physical and half-simulation test method, but the software logic of the simulated peripheral device is complex, difficult to develop, and complex to upgrade and maintain

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