A classification method for industrial product defect images based on knowledge graph
An industrial product and knowledge map technology, applied in the field of computer vision, can solve the problems of unbalanced and small differences in categories of defects, achieve the effect of improving robustness, good versatility and universality, and reducing the dependence of defect samples
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[0033] The purpose and effects of the present invention will become clearer by describing the present invention in detail according to the accompanying drawings and preferred embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0034] Such as figure 1 As shown, the knowledge graph-based industrial product defect image classification method of the present invention comprises the following steps:
[0035] S1: Create defect gallery X, label library Y corresponding to each defect map, and additional attribute vector V corresponding to defect category;
[0036] S2: Using the image enhancement technology to enhance the defect map to obtain the enhanced defect library X′.
[0037] S3: Construct defect image feature extraction network, and then continuously obtain image batches x from the defect gallery X′ enhanced by S2 B and its corresponding label y B . Batch defe...
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