Embedded memory testing method, device, equipment and computer storage medium

A technology of embedded memory and test method, applied in static memory, instruments and other directions, can solve the problems of low test efficiency and high cost of embedded memory, and achieve the effects of reducing test labor cost, saving manpower and improving test efficiency

Active Publication Date: 2021-10-19
BIWIN STORAGE TECH CO LTD
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The main purpose of the present invention is to propose a test method for embedded memory, aiming at solving the problems of low test efficiency and high cost of current embedded memory

Method used

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  • Embedded memory testing method, device, equipment and computer storage medium
  • Embedded memory testing method, device, equipment and computer storage medium
  • Embedded memory testing method, device, equipment and computer storage medium

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Embodiment Construction

[0049] The solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Apparently, the described embodiments are only part of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0050] The present invention proposes a kind of embedded memory testing method, and embedded memory comprises eMMC and DDR, wherein, refer to figure 1 , the embedded memory test method includes:

[0051] Step S10: receiving a first signal instruction for testing the eMMC, controlling the eMMC to start testing according to the first signal instruction, and feeding back a corresponding test signal.

[0052] The embedded memory testing method of the present invent...

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Abstract

The invention discloses a method for testing an embedded memory, the embedded memory includes eMMC and DDR, wherein the method for testing the embedded memory includes: receiving a first signal instruction for testing the eMMC, and according to the first signal The instruction controls the eMMC to start testing, and feeds back a corresponding test signal; receives a second signal instruction generated according to the test signal to test the DDR, and controls the DDR to start testing according to the second signal instruction; Obtain the test results of the eMMC and DDR, and determine whether the embedded memory is qualified according to the test results of the eMMC and DDR. The embedded memory testing method of the present invention can test eMMC and DDR at the same time, save testing time, improve testing efficiency and reduce cost. In addition, the invention also discloses an embedded memory testing device, equipment and computer storage medium.

Description

technical field [0001] The invention relates to the technical field of chip testing, in particular to a testing method, device, equipment and computer storage medium of an embedded memory. Background technique [0002] With the development and progress of science and technology, embedded memories are widely used in various mobile electronic devices. Among them, eMCP and Emop, which belong to embedded memory, are formed by combining DDR (Double Data Rate, double-rate synchronous dynamic random access memory) and eMMC (Embedded Multi Media Card, embedded multimedia card). Compared with traditional DDR, MCP, eMOP and other memories, the embedded memory has a NAND Flash control chip inside, which can reduce the computing burden of the main chip, manage larger-capacity flash memory, and greatly reduce the application of electronic products area. [0003] Embedded memory needs to be tested for DDR and eMMC during the production process. After the DDR and eMMC tests are passed, t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/08G11C29/56
CPCG11C29/08G11C29/56
Inventor 叶欣张翔黄裕全
Owner BIWIN STORAGE TECH CO LTD
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