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Electromagnetic pulse interference test system and method

A technology of electromagnetic pulse and interference testing, which is applied in digital circuit testing, electronic circuit testing, short-circuit testing, etc., can solve problems such as low efficiency, and achieve the effect of improving testing efficiency

Active Publication Date: 2020-06-09
XIDIAN UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this way, the efficiency of EMI testing for digital circuits is relatively low

Method used

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  • Electromagnetic pulse interference test system and method
  • Electromagnetic pulse interference test system and method
  • Electromagnetic pulse interference test system and method

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Embodiment Construction

[0033] The present invention will be described in further detail below in conjunction with specific examples, but the embodiments of the present invention are not limited thereto.

[0034] In order to improve the testing efficiency of electromagnetic pulse interference testing, an embodiment of the present invention provides an electromagnetic pulse interference testing system and method.

[0035] Firstly, an electromagnetic pulse interference testing system provided by an embodiment of the present invention is described in detail. like figure 1 As shown, the system may include: a transmission line pulse testing device 10, a digital circuit to be tested 20 and an auxiliary monitoring device 30;

[0036] Wherein, the digital circuit 20 has pre-designated at least one port to be tested, at least one status port, and an output port corresponding to each port to be tested; wherein, the at least one status port is a port representing the working state of the digital circuit.

[0...

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Abstract

The invention discloses an electromagnetic pulse interference test system and method. The system comprises a transmission line pulse test device, a to-be-tested digital circuit and an auxiliary monitoring device. The digital circuit is provided with at least one to-be-tested port, at least one state port and an output port corresponding to each to-be-tested port, wherein the to-be-tested port andthe state port are specified in advance, And the at least one state port represents the working state of the digital circuit; the transmission line pulse test equipment is used for injecting an electromagnetic pulse into each to-be-tested port and monitoring the leakage current of the output port corresponding to the to-be-tested port; the auxiliary monitoring device comprises a plurality of auxiliary monitoring units; each state port is correspondingly connected with one of the plurality of auxiliary monitoring units; and each auxiliary monitoring unit connected with a state port is used formonitoring signals of the connected state port in real time. According to the invention, the test efficiency of electromagnetic pulse interference test can be improved.

Description

technical field [0001] The invention belongs to the technical field of electromagnetic pulse interference testing, and in particular relates to an electromagnetic pulse interference testing system and method. Background technique [0002] With the development of pulse power amplification technology, radar antenna technology and pulse weapon technology, the electromagnetic environment is becoming more and more complex, and digital circuits are more and more susceptible to electromagnetic pulse interference; when electromagnetic pulses are coupled into digital circuits, instantaneous High-amplitude voltage and / or current; when the generated voltage and / or current exceeds the capacity of the circuit, it will cause damage or even damage to the digital circuit. Therefore, it is necessary to conduct electromagnetic pulse interference tests on digital circuits to understand the immunity of digital circuits to electromagnetic pulses. When testing, it is necessary to input electroma...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00G01R31/317G01R31/28G01R31/52
CPCG01R31/002G01R31/2841G01R31/2843G01R31/317G01R31/31713
Inventor 柴常春李阳刘彧千吴涵李福星
Owner XIDIAN UNIV
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