Test system of motion control device

A motion control device and testing system technology, applied in general control systems, control/regulation systems, testing/monitoring control systems, etc., can solve the problems of long testing time and low testing efficiency, so as to improve testing efficiency and avoid manual testing. , the effect of saving test time

Pending Publication Date: 2020-06-16
上海柏楚数控科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The invention provides a test system for a motion control device to solve the problems of long test time and low test efficiency

Method used

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  • Test system of motion control device
  • Test system of motion control device
  • Test system of motion control device

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Embodiment Construction

[0086] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0087] The terms "first", "second", "third", "fourth", etc. (if any) in the description and claims of the present invention and the above drawings are used to distinguish similar objects and not necessarily Describe a specific order or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstances such that the embodiments of the invention described herein can be practiced in sequences other than those illustrated or...

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Abstract

The invention provides a test system of a motion control device. The test system comprises an EMC test instrument, a function test device, an upper computer and a test instrument platform, wherein thefunction test device is connected with an interactive interface of a to-be-tested motion control device; the function test device is used for monitoring an interaction signal of the interaction interface; the test instrument platform comprises at least two test instruments, and different test instruments are connected to different circuit modules of the to-be-tested motion control device so as toacquire operation information of the corresponding circuit module; the upper computer is used for determining whether the function of the to-be-tested motion control device corresponding to the interaction signal is abnormal or not according to the interaction signal or the state information of the interaction signal, and obtaining a function test result for the to-be-tested motion control device; and according to the received operation information, whether the corresponding circuit module is abnormal or not is determined, and a circuit test result for the to-be-tested motion control device is obtained.

Description

technical field [0001] The invention relates to the field of motion control devices, in particular to a test system for a motion control device. Background technique [0002] The motion control device can be understood as a device that can directly or indirectly control the movement of a moving object (such as a cutting head). For example, it can be a motion control board. Taking the cutting head as an example, the motion control device can control the cutting head. The control of the driver realizes the motion control of the cutting head. [0003] In the existing related art, before the motion control device is put into use, it is necessary to test the function of the motion control device. In the existing related art, it is usually implemented by manual testing. However, manual testing will lead to a long test time. Low efficiency and other issues. Contents of the invention [0004] The invention provides a test system for a motion control device to solve the problems ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B23/02G01R31/00
CPCG01R31/00G01R31/001G05B23/0213G05B2219/24065
Inventor 卢琳章胜平吴文武
Owner 上海柏楚数控科技有限公司
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