Error Compensation Method and Measurement Error Evaluation Method Based on Biaxial Symmetry Standard
A biaxial symmetry and measurement error technology, applied in the direction of measuring devices, instruments, etc., can solve problems such as large measurement deviation, no measurement deviation compensation, and partial area evaluation distortion of the instrument, so as to achieve representativeness, persuasiveness, and improvement The effect of accuracy
Active Publication Date: 2021-05-18
CHONGQING ACAD OF METROLOGY & QUALITY INST
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Problems solved by technology
However, at present, when detecting, calibrating and evaluating the error of the measurement system, the phenomenon that the standard instrument crosses the error level area is often ignored, which easily leads to excessive measurement deviation of a single standard object, which in turn leads to serious distortion of the local area evaluation of the instrument, and overall area evaluation. Practical issues such as non-compliance with requirements
[0003] Therefore, in order to be able to accurately evaluate the measurement error of the instrument, it is necessary to compensate and correct the error measurement value of the instrument first, but there is no method to compensate the measurement deviation caused by the standard device crossing the error level area
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[0031] The present invention will be further described in detail below in conjunction with the accompanying drawings and preferred embodiments.
[0032] The error level in the same measurement area is the same, and the measurement error increases linearly with the increase of the measurement range; in different measurement areas, the error level is different, and as the error level increases, the measurement error will increase in a corresponding step. Based on the error level of the instrument measurement space, the correlation coefficient function distribution diagram is established, such as figure 1 Shown: The vertical axis represents the measurement error, and the horizontal axis (X axis) represents the error level, such as 0~τ level, taking the 0 error level (minimum error level) as a reference, the linear change coefficient corresponding to the 0 error level is 1, and the correlation coefficient A function can be defined as:
[0033]
[0034] Among them, k τ is the ...
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The invention discloses an error compensation method based on a biaxial symmetric standard, which includes the following steps: dividing the measurement space into several measurement areas; the error levels in the same measurement area are the same, and the measurement error is at the same linear level as the measurement range expands. The coefficient of variation increases; let the coefficient of linear variation of the τ measurement area corresponding to the τ error level be k τ , then the correlation coefficient of τ measurement area is δ τ =1 / k τ ; Match the corresponding correlation coefficient for the node according to the measurement area where the node is located on the standard device and the correlation coefficient matching criterion; the corrected correlation coefficient of the node is equal to the product of the weight level of the node and the matching correlation coefficient; error measurement value. Based on the error compensation method based on the biaxial symmetry standard of the invention, the invention also discloses a local measurement error evaluation method and an overall measurement error evaluation method. The invention can improve the accuracy of error detection, and improve the representativeness and persuasiveness of measurement error evaluation.
Description
technical field [0001] The invention relates to the technical field of error detection, in particular to an error compensation method and a measurement error evaluation method. Background technique [0002] Standards are high-precision devices used to test measurement systems or measuring instruments. The biaxially symmetrical etalon means that the standard units (standard balls, standard holes and other geometric shapes) on the etalon are distributed according to the topological structure that is symmetrical to the X-axis and Y-axis of the etalon. Since the error level of the measuring instrument decreases with the expansion of the measurement range, within a certain measurement range of the instrument, the measurement error often has the characteristics of linearly increasing with the expansion of the measurement range, and with the expansion of the measurement range, the instrument error There is a step change in the level (that is, non-linear characteristics)). The pla...
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IPC IPC(8): G01B21/00
CPCG01B21/042
Inventor 徐健周森颜宇陶磊倪颖倩熊俊
Owner CHONGQING ACAD OF METROLOGY & QUALITY INST