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Modeling and reliability simulation method for fault mechanism triggering

A technology of failure mechanism and simulation method, applied in design optimization/simulation, electrical digital data processing, instruments, etc., to achieve scientific and reasonable reliability indicators

Active Publication Date: 2020-06-26
BEIHANG UNIV +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to propose a reliability modeling method that describes and evaluates the trigger relationship between failure mechanisms in a complex system and solves the influence of the trigger relationship between failure mechanisms in a complex system on system reliability

Method used

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  • Modeling and reliability simulation method for fault mechanism triggering
  • Modeling and reliability simulation method for fault mechanism triggering
  • Modeling and reliability simulation method for fault mechanism triggering

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Embodiment Construction

[0067] Hereinafter, embodiments of the present invention will be described with reference to the drawings.

[0068] The modeling and reliability simulation method triggered by the failure mechanism of the present invention can be applied to the analysis of various failure mechanisms. The following is an example of the conductive slip ring device involved in the sun-directed electromechanical device of the solar cell. The method is exemplarily described in detail, but obviously the present invention is not limited thereto.

[0069] The electromechanical device for solar cell orientation to the sun is a device that receives control signals and drives the solar cell array to align itself with the sun so that it can always obtain the maximum solar energy conversion efficiency. At the same time, the electric power and electrical signal on the cell array pass through the internal conductive slip ring A device that teleports into the interior of a star. The specific structure includ...

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Abstract

The invention provides a modeling and reliability simulation method for fault mechanism triggering. A physical process that a fault mechanism is triggered is described through a random process; a fault time model of two triggering relationships of a degradation-degradation type and a degradation-overstress type is provided; and different models are provided for the continuous degradation process and the discrete degradation process, so that the problem that the reliability distribution of each component is purely considered and the correlation between fault mechanisms is not considered when the reliability of the system is calculated by the traditional reliability modeling method is solved, and the fault time distribution and the reliability distribution of the system are deduced on the basis. According to the method, a new idea is provided for describing and evaluating the trigger effect in the complex system and solving the influence of the trigger effect in the complex system on thesystem reliability, and the calculated reliability index is more scientific and reasonable.

Description

technical field [0001] The invention belongs to the field of product reliability modeling, and in particular relates to a system reliability modeling method considering the mutual trigger relationship between fault mechanisms, and in particular to a modeling and reliability simulation method aimed at fault mechanism triggering. Background technique [0002] With the advancement of science and technology, products show a development trend of integration, intelligence, and complexity, and users have also put forward higher requirements for product reliability. In the reliability research of complex systems, the failure mechanism correlation has been paid more and more attention, because it will increase the joint failure probability of the system and reduce the reliability of the system. Common fault mechanism correlations include common cause failure (CCF), fault propagation (FP), functional correlation (FDEP), cascading faults, etc. They all have a common feature that trigg...

Claims

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Application Information

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IPC IPC(8): G06F30/20G06F119/02
Inventor 陈颖李姝敏方家玥康锐李亚萍柳征勇郭其威
Owner BEIHANG UNIV
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