Modeling and Reliability Simulation Method for Triggering of Fault Mechanism in Complex System

A failure mechanism and complex system technology, applied in design optimization/simulation, electrical digital data processing, instruments, etc., to achieve scientific and reasonable reliability indicators
CN111339682BActive Publication Date: 2022-03-15BEIHANG UNIV +1
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Patent Information

Authority / Receiving Office
CN ยท China
Patent Type
Patents(China)
Current Assignee / Owner
BEIHANG UNIV
Publication Date
2022-03-15

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Abstract

The present invention proposes a modeling and reliability simulation method for fault mechanism triggering, describes the physical process of the fault mechanism being triggered through a random process, and proposes two trigger relationships of degradation-degradation and degradation-overstress. It provides different models for the continuous degradation process and the discrete degradation process, so as to solve the problem that the traditional reliability modeling method only considers the reliability distribution of each component when calculating the system reliability, and does not consider the correlation between failure mechanisms. , and on this basis, the system failure time distribution and reliability distribution are deduced. The invention provides a new idea for describing and evaluating the trigger effect in the complex system and solving the influence of the trigger effect on the reliability of the system in the complex system, and the calculated reliability index is more scientific and reasonable.
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Description

technical field

[0001] The invention belongs to the field of product reliability modeling, and in particular relates to a system reliability modeling method considering the mutual trigger relationship between fault mechanisms, in particular to a modeling and reliability simulation method for triggering of complex system fault mechanisms . Background technique

[0002] With the advancement of science and technology, products show a development trend of integration, intelligence, and complexity, and users have also put forward higher requirements for product reliability. In the reliability research of complex systems, the failure mechanism correlation has been paid more and more attention, because it will increase the joint failure probability of the system and reduce the reliability of the system. Common fault mechanism correlations include common cause failure (CCF), fault propagation (FP), functional correlation (FDEP), cascading faults, etc. They all have a common featur...

Claims

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