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Modeling and Reliability Simulation Method for Triggering of Fault Mechanism in Complex System

A failure mechanism and complex system technology, applied in design optimization/simulation, electrical digital data processing, instruments, etc., to achieve scientific and reasonable reliability indicators

Active Publication Date: 2022-03-15
BEIHANG UNIV +1
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is to propose a reliability modeling method that describes and evaluates the trigger relationship between failure mechanisms in a complex system and solves the influence of the trigger relationship between failure mechanisms in a complex system on system reliability

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  • Modeling and Reliability Simulation Method for Triggering of Fault Mechanism in Complex System
  • Modeling and Reliability Simulation Method for Triggering of Fault Mechanism in Complex System
  • Modeling and Reliability Simulation Method for Triggering of Fault Mechanism in Complex System

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Embodiment Construction

[0067] Hereinafter, embodiments of the present invention will be described with reference to the drawings.

[0068] The modeling and reliability simulation method for complex system failure mechanism triggering of the present invention can be applied to the analysis of various failure mechanisms. The following will only take the conductive slip ring device involved in the sun-directed electromechanical device of the solar cell as an example, and describe the present invention The inventive method is exemplarily described in detail, but obviously the present invention is not limited thereto.

[0069] The electromechanical device for solar cell orientation to the sun is a device that receives control signals and drives the solar cell array to align itself with the sun so that it can always obtain the maximum solar energy conversion efficiency. At the same time, the electric power and electrical signal on the cell array pass through the internal conductive slip ring A device that...

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Abstract

The present invention proposes a modeling and reliability simulation method for fault mechanism triggering, describes the physical process of the fault mechanism being triggered through a random process, and proposes two trigger relationships of degradation-degradation and degradation-overstress. It provides different models for the continuous degradation process and the discrete degradation process, so as to solve the problem that the traditional reliability modeling method only considers the reliability distribution of each component when calculating the system reliability, and does not consider the correlation between failure mechanisms. , and on this basis, the system failure time distribution and reliability distribution are deduced. The invention provides a new idea for describing and evaluating the trigger effect in the complex system and solving the influence of the trigger effect on the reliability of the system in the complex system, and the calculated reliability index is more scientific and reasonable.

Description

technical field [0001] The invention belongs to the field of product reliability modeling, and in particular relates to a system reliability modeling method considering the mutual trigger relationship between fault mechanisms, in particular to a modeling and reliability simulation method for triggering of complex system fault mechanisms . Background technique [0002] With the advancement of science and technology, products show a development trend of integration, intelligence, and complexity, and users have also put forward higher requirements for product reliability. In the reliability research of complex systems, the failure mechanism correlation has been paid more and more attention, because it will increase the joint failure probability of the system and reduce the reliability of the system. Common fault mechanism correlations include common cause failure (CCF), fault propagation (FP), functional correlation (FDEP), cascading faults, etc. They all have a common featur...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F30/20G06F119/02
Inventor 陈颖李姝敏方家玥康锐李亚萍柳征勇郭其威
Owner BEIHANG UNIV
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