Memory test method and device and readable memory

Abstract

The invention relates to a memory test method and device and a readable memory, and the test method comprises the steps: carrying out the read-write operation of the memory, and obtaining a target write mapping value according to write data through a preset mapping algorithm; and obtaining a target read mapping value according to read data through the preset mapping algorithm, and judging whetherthe memory has a fault or not by comparing the target read mapping value with the target write mapping value. By implementing the technical scheme, the storage space can be saved, and the applicationrange is wider.

Description

technical field [0001] The invention relates to the field of memory testing, in particular to a memory testing method, device and readable memory. Background technique [0002] In the SOC system, with the improvement of integrated circuit integration and complexity, the chip area occupied by the embedded memory is getting larger and larger. Due to the dense transistors in the embedded memory, there are high wiring density, high complexity and high operating frequency, etc. Factors, the failure rate of embedded memory is also increasing, which may lead to a decline in chip yield. Some methods may be used to repair the faulty embedded memory so that it can work normally. Therefore, it is a very important issue to correctly test whether the embedded memory has a fault. [0003] The traditional memory test method is to compare whether the read and write data are the same, and judge whether there is a fault in the memory by comparing the read and write data. If the written data ...

AI Technical Summary

Problems solved by technology

[0010] For most of the faults, the traditional memory test method can be tested, but for some coupling faults may not be tested

For example, several storage bits of a storage unit jump to 0 or 1 at the same time. This kind of fault cannot be tested by traditional memory test methods, because the data written and read by traditional memory test methods has its own rules. , thus limiting the application of the memory test method

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