Memory testing method, device and readable memory

Abstract

The present invention relates to a memory test method, device and readable memory. The test method includes: performing read and write operations on the memory, and obtaining a target write mapping value according to the write data through a preset mapping algorithm; through the preset The mapping algorithm obtains a target read mapping value according to the read data, and judges whether there is a fault in the memory by comparing the target reading mapping value with the target writing mapping value. The implementation of the technical scheme of the present invention can save storage space and has wider application range.

Description

technical field [0001] The invention relates to the field of memory testing, in particular to a memory testing method, device and readable memory. Background technique [0002] In the SOC system, with the improvement of integrated circuit integration and complexity, the chip area occupied by the embedded memory is getting larger and larger. Due to the dense transistors in the embedded memory, there are high wiring density, high complexity and high operating frequency, etc. Factors, the failure rate of embedded memory is also increasing, which may lead to a decline in chip yield. Some methods may be used to repair the faulty embedded memory so that it can work normally. Therefore, it is a very important issue to correctly test whether the embedded memory has a fault. [0003] The traditional memory test method is to compare whether the read and write data are the same, and judge whether there is a fault in the memory by comparing the read and write data. If the written data ...

AI Technical Summary

Problems solved by technology

[0010] For most of the faults, the traditional memory test method can be tested, but for some coupling faults may not be tested

For example, several storage bits of a storage unit jump to 0 or 1 at the same time. This kind of fault cannot be tested by traditional memory test methods, because the data written and read by traditional memory test methods has its own rules. , thus limiting the application of the memory test method

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