Test fixture for insulated gate bipolar transistor

Abstract

The invention discloses a test fixture for an insulated gate bipolar transistor. The test fixture comprises a base, one side of the base is fixedly connected with a supporting plate. The test fixtureis simple in structure, and convenient to use, the arranged rotating shaft can drive the two-way screw rod to rotate through the engaged bevel gear set; the two-way lead screw can drive the two movingplates to slide along the sliding grooves when rotating; the movable plate can drive the two guide plates to relatively move along the base when sliding; therefore, the distance between the two guideplates can be adjusted; the insulated gate bipolar transistors with different sizes and models can be conveniently clamped by the test fixture; and the arranged servo motor can drive the square pushtube through the external thread screw rod to push the insulated gate bipolar transistor to move towards the PCB, so that a probe of the insulated gate bipolar transistor can be conveniently aligned with a probe interface on the PCB, the insulated gate bipolar transistor can be conveniently tested, and the test efficiency is greatly improved.

Description

technical field [0001] The invention relates to a test fixture, in particular to a test fixture for an insulated gate bipolar transistor, and belongs to the technical field of the insulated gate bipolar transistor. Background technique [0002] Insulated gate bipolar transistors combine the advantages of power transistors and power field effect transistors, have good characteristics, and have a wide range of applications; IGBTs are also three-terminal devices: gate, collector and emitter. With the rapid development of industry, a large number of new semiconductor devices are used in industrial equipment. As a widely used new semiconductor device, the insulated gate bipolar transistor module has a great influence on its production efficiency and product quality due to the convenience and accuracy of its testing. important factor. After the insulated gate bipolar transistors are produced, they need to be aligned for inspection. Existing test fixtures for insulated gate bipol...

AI Technical Summary

Problems solved by technology

Existing test fixtures for insulated gate bipolar transistors require inspectors to hold the insulated gate bipolar transistors in their hands when testing the insulated gate bipolar transistors, manually insert the insulated gate bipolar transistors into the test points for detection, and manually insert the insulated gate bipolar transistors into the test points. In the case of bipolar transistors, the pins of the IGBT and the test points are not connected neatly, which will cause the probes of the IGBT to deform, damage the IGBT, and the efficiency of manual testing is low

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