Reference voltage trimming system and corresponding reference voltage trimming method

Abstract

The invention relates to a reference voltage trimming system and a corresponding reference voltage trimming method; the method includes changing the reference voltage calibration work completed by a traditional tester in the prior art into reference voltage trimming work completed by the reference voltage trimming circuit in the system for reference voltage trimming; integrating the reference voltage trimming circuit in the to-be-tested circuit needing reference voltage trimming, so that the working content of the tester is simplified, the tester only needs to be responsible for input and comparison of test signals, the reference voltage calibration work in the whole system can be completed by a hardware structure, and an auxiliary test program is not needed. By adopting the reference voltage trimming system and the corresponding reference voltage trimming method, calibration work is executed in the circuit, so that the calibration result is slightly influenced by external interference, the accuracy is high, and the system and the method have the advantages of low cost, simple structure, high test speed, accurate precision, easiness in implementation and wide applicability.

Description

technical field [0001] The present invention relates to the field of circuit technology, in particular to the field of circuit calibration, in particular to a system for trimming a reference voltage and a corresponding method for trimming a reference voltage. Background technique [0002] In the prior art, the circuit including the analog-to-digital conversion module generally has its own internal reference function module. However, due to the influence of process fluctuations, the actual reference voltage generated by the integrated internal reference function module will fluctuate within a certain range. In order to meet the actual The requirements for the voltage test accuracy in the application, in the prior art, generally consider trimming the reference voltage generated by the circuit to be tested (the circuit to be tested refers to a circuit including an analog-to-digital conversion module) (the reference voltage that needs to be trimmed can be adjusted) The voltage i...

AI Technical Summary

Problems solved by technology

[0010] 1. After the reference voltage is output, it will be interfered by external factors, which cannot take into account the test accuracy and speed;

[0011] 2. When trimming and adjusting the reference voltage output by multiple circuits under test at the same time, it is impossible to take into account the efficiency and cost issues;

[0012] 3. The selection of the voltage trimming value needs to be processed by software intervention, which increases the complexity of the test program design;

[0013] 4. In the test process of writing voltage trimming values ​​to multiple circuits under test at the same time, the complex program of test program design will be added

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