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Photoelastic high-speed Mueller matrix ellipsometer and in-situ calibration and measurement method thereof

A Muller matrix and ellipsometer technology, which is applied in the field of photoelastic high-speed Muller matrix ellipsometer and its in-situ calibration and measurement, can solve problems such as difficulty in breaking through millisecond-level measurement time resolution and so on.

Inactive Publication Date: 2020-07-14
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0006] Aiming at the above defects or improvement needs of the prior art, the present invention provides a photoelastic high-speed Mueller matrix ellipsometer and its in-situ calibration and measurement method, thereby solving the problem that the prior art is difficult to break through the measurement time resolution of milliseconds. rate technical issues

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  • Photoelastic high-speed Mueller matrix ellipsometer and in-situ calibration and measurement method thereof
  • Photoelastic high-speed Mueller matrix ellipsometer and in-situ calibration and measurement method thereof
  • Photoelastic high-speed Mueller matrix ellipsometer and in-situ calibration and measurement method thereof

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[0041] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0042] Such as figure 1 Shown is a photoelastic high-speed Mueller matrix ellipsometer related to the present invention, which includes a high-speed polarization module, a sample adjustment module and a real-time polarization analysis module. The high-speed polarization module and the real-time polarization analysis module are distributed on both sides of the sample adjustment module and instal...

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Abstract

The invention discloses a photoelastic high-speed Mueller matrix ellipsometer and an in-situ calibration and measurement method thereof, and belongs to the technical field of optical measurement. Thephotoelastic high-speed Mueller matrix ellipsometer comprises a high-speed polarization module, a sample adjustment module and a real-time polarization analysis module. The in-situ calibration methodof the photoelastic high-speed Mueller matrix ellipsometer is implemented based on Bessel function infinite series expansion and discrete Fourier transform, the peak value and the static retardation of the photoelastic modulator are obtained at the same time, and high precision and high sensitivity of the photoelastic modulator in the whole working range are ensured. The measurement method of thephotoelastic high-speed Mueller matrix ellipsometer is carried out on the basis of double photoelastic modulation and spatial light splitting demodulation, and in-situ and high-precision measurement of the sample Mueller matrix can be realized under microsecond time resolution. Benefited from the high temporal resolution acquisition of the Mueller matrix, the method can be used for characterizingthe dynamic optical properties of the material in the rapid reaction process.

Description

technical field [0001] The invention belongs to the technical field related to optical measurement, and more specifically relates to a photoelastic high-speed Mueller matrix ellipsometer and an in-situ calibration and measurement method thereof. Background technique [0002] In some fast reaction processes, such as polymerization reaction and particle migration process, there are often rapid changes in local physical properties and shimmering nanostructures. For these rapid reaction processes involving different spatial scales (nanometers to microns or even larger scales) and time scales (microseconds to tens of seconds), due to the lack of means of synchronous observation, the regulation of the reaction process mostly needs to be continuously adjusted. Experience can achieve the desired effect. Therefore, in order to deeply understand the mechanism of these rapid reactions and realize the accurate control of the reaction process, it is of great significance to develop inst...

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Application Information

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IPC IPC(8): G01N21/21G01N21/01
CPCG01N21/01G01N21/211G01N2021/0112
Inventor 江浩张松刘世元刘佳敏谷洪刚
Owner HUAZHONG UNIV OF SCI & TECH
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