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Material emissivity pollution influence in-situ real-time testing method and device

A real-time test and emissivity technology, applied in the field of satellite space environmental engineering, which can solve problems such as material emissivity pollution

Inactive Publication Date: 2020-10-13
BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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Problems solved by technology

[0005] The purpose of the present invention is to provide an in-situ real-time testing method and device for the influence of material emissivity pollution, so as to solve the problem of the composition, quality and thickness of pollutants adsorbed on the surface of deep and low temperature optical devices that require deep low temperature working conditions below 40K for large and highly sensitive space optical devices , optical and other effect data acquisition problems, develop a ground simulation test device for deep and low temperature environments, and realize real-time in-situ measurement of pollutant characteristics; at the same time, the invention can also be used as a technical approach for the analysis and testing of background pollutants in various vacuum test systems

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  • Material emissivity pollution influence in-situ real-time testing method and device

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Embodiment Construction

[0017] The interference light elimination structure applicable to the ionospheric photometer without moving parts of the present invention will be described in detail below in conjunction with the accompanying drawings. These specific embodiments are only used to illustrate the present invention and are not intended to limit its protection scope.

[0018] see Figure 1-2 ,

[0019] A kind of material emissivity pollution influence in-situ real-time test method of the present invention has the following steps:

[0020] A laser is used to emit a beam of light, and after splitting, one beam enters the vacuum tank through the window of the vacuum tank, and the diffusion unit in the vacuum tank deposits the pollutants on the deposition sheet to form a thin film; the beam is reflected by the deposition sheet, and after receiving the reflected beam outside the vacuum tank, the The phase comparison of the other beam of light is carried out to obtain the real-time change of the film t...

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Abstract

The invention relates to a material emissivity pollution influence in-situ real-time testing method and device. The method comprises the steps: enabling a laser to emit a light beam, splitting the light beam, enabling one light beam to enter a vacuum tank, and enabling a diffusion unit in the vacuum tank to deposit a pollutant on a deposition piece; reflecting the light beam through a deposition sheet, after the reflected light beam is received outside the vacuum tank, carrying out phase comparison with the other beam of split light, and acquiring a real-time change condition of a film thickness of the deposition piece; and verifying and calibrating a result and data obtained by a quartz crystal microbalance at the same position of the deposition piece, and using a laser light path to carry out optical characteristic testing on the pollutant film deposited on the deposition piece. In the invention, a problem that a large-scale high-sensitivity space optical device needs a profound hypothermia working condition, and the problem of in-situ real-time acquisition of effect data of components, mass, thickness, optics and the like of pollutants adsorbed on the surface of a profound hypothermia optical device are solved, a profound hypothermia environment ground simulation test device is developed, real-time in-situ measurement of pollutant characteristics is realized, and meanwhile,the method and the device can also be used for testing the background cleanliness of the vacuum tank.

Description

technical field [0001] The invention belongs to the technical field of satellite space environment engineering, and in particular relates to an in-situ real-time testing method and device for the influence of material emissivity pollution. Background technique [0002] A large number of organic polymer materials are used on spacecraft, and these materials will produce outgassing phenomenon in the orbital vacuum environment and release molecular pollutants. Molecular pollutants condense on sensitive surfaces, causing pollution effects, such as affecting the emissivity and absorptivity of the thermal control surface of the spacecraft, making it deviate from the design value, causing abnormal operating temperature of the instrument, and affecting the normal operation of the instrument. Therefore, it is necessary to evaluate the effect of material outgassing pollution on the absorptivity and emissivity of thermal control materials. High-sensitivity space optical devices usually...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/84G01N5/00
CPCG01N21/8422G01N5/00
Inventor 牟永强焦子龙杨晓宁刘宇明姜海富田东波
Owner BEIJING INST OF SPACECRAFT ENVIRONMENT ENG
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