DCFP system reliability modeling method considering promotion and accumulation coupling effects
A modeling method and coupling effect technology, applied in data processing applications, instrumentation, design optimization/simulation, etc., can solve problems such as failure to fully consider the coupling behavior of failure mechanisms
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[0064] Exemplary embodiments, features, and aspects of the present invention will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.
[0065] The following embodiments use formula derivation and BDD model (binary decision diagram model) to model the wires in the chip of the control system module in a certain high-speed rail and carry out MATLAB simulation analysis to reflect the beneficial effects of the present invention.
[0066] The present invention is a DCFP system reliability modeling method considering promotion and cumulative coupling effects, such as Figure 9 As shown, the specific implementation steps are as follows:
[0067] S1: Analyze and determine the key failure mechanism and key failure mechanism type ...
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