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DCFP system reliability modeling method considering promotion and accumulation coupling effects

A modeling method and coupling effect technology, applied in data processing applications, instrumentation, design optimization/simulation, etc., can solve problems such as failure to fully consider the coupling behavior of failure mechanisms

Active Publication Date: 2020-07-28
BEIHANG UNIV
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Problems solved by technology

[0006] In order to overcome the defects of the prior art, the purpose of the present invention is to solve the problem that the existing modeling method cannot fully consider the coupling behavior of the fault mechanism in the DCFP system, and provide a theoretical description and mathematical construction for the coupling behavior relationship between the promotion of the fault mechanism and the cumulative effect. model, and combine the FMT model with the BDD model to model the coupling behavior of the failure mechanism to facilitate simulation analysis

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  • DCFP system reliability modeling method considering promotion and accumulation coupling effects
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  • DCFP system reliability modeling method considering promotion and accumulation coupling effects

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Embodiment Construction

[0064] Exemplary embodiments, features, and aspects of the present invention will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0065] The following embodiments use formula derivation and BDD model (binary decision diagram model) to model the wires in the chip of the control system module in a certain high-speed rail and carry out MATLAB simulation analysis to reflect the beneficial effects of the present invention.

[0066] The present invention is a DCFP system reliability modeling method considering promotion and cumulative coupling effects, such as Figure 9 As shown, the specific implementation steps are as follows:

[0067] S1: Analyze and determine the key failure mechanism and key failure mechanism type ...

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Abstract

The invention provides a DCFP system reliability modeling method considering promotion and accumulation coupling effects. The DCFP system reliability modeling method comprises the following steps of S1, analyzing and determining a key fault mechanism and a key fault mechanism type of degradation stress and impact stress generated by a certain part in a system in work; S2, establishing a soft failure model for a failure mechanism of generating degradation stress for the part; S3, establishing a reliability model for the fault mechanism component generating the impact stress of the component; s4, obtaining the reliability of the component according to the mutual competition relationship between the soft failure and the hard failure of the component; s5, modeling the component by utilizing the fault mechanism tree FMT model and the binary decision diagram BDD model; S6, performing reliability simulation on the mechanism model and the component model by utilizing Matlab, and obtaining a damage amount curve, a hard failure threshold value descending curve and a reliability curve of the component according to requirements.

Description

technical field [0001] The invention relates to the field of product reliability, in particular to a DCFP system reliability modeling method considering promotion and accumulation coupling effects. Background technique [0002] With the deepening understanding of reliability in engineering technology, users have put forward higher requirements for product reliability. In the field of reliability, reliability modeling and simulation are important methods to evaluate system reliability, and the use of fault physical models and fault behavior models frees reliability prediction from the shackles of mathematical statistics, enabling high-precision, low-failure data Product reliability can be more accurately simulated. However, due to the complexity of the system structure and environment, a system may experience different types of failures. From the mechanism, the failure can be divided into two types: degeneration failure and impact (or excessive stress) failure, which are al...

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Application Information

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IPC IPC(8): G06F30/20G06Q10/06G06F119/14
CPCG06Q10/0639
Inventor 陈颖杨天钰王艳芳康锐
Owner BEIHANG UNIV
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