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Defect detection method and device for AMOLED display screen, computer equipment and storage medium

A defect detection and display technology, which is applied in the display field, can solve problems such as the complexity of the AMOLED display detection process, and achieve the effects of solving the relatively complicated detection process, improving detection efficiency, and reducing the amount of calculation

Active Publication Date: 2020-07-31
HARBIN INSTITUTE OF TECHNOLOGY SHENZHEN (INSTITUTE OF SCIENCE AND TECHNOLOGY INNOVATION HARBIN INSTITUTE OF TECHNOLOGY SHENZHEN)
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Problems solved by technology

[0005] The present invention provides a defect detection method, device, computer equipment and storage medium of an AMOLED display screen to solve the problem that the detection process of the AMOLED display screen in the prior art is relatively complicated

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  • Defect detection method and device for AMOLED display screen, computer equipment and storage medium
  • Defect detection method and device for AMOLED display screen, computer equipment and storage medium
  • Defect detection method and device for AMOLED display screen, computer equipment and storage medium

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Embodiment Construction

[0032] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0033] The defect detection method of the AMOLED display screen provided by the embodiment of the present invention can be applied to such as figure 1 In the illustrated application environment, the acquisition device communicates with the computing device. The acquisition device collects the image to be tested including the target AMOLED display, then extracts the image of the target area in the image to be tested, and then preprocesses the image of t...

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Abstract

The invention relates to the technical field of display screens, and provides a defect detection method and device for an AMOLED display screen, computer equipment and a storage medium. The defect detection method for the AMOLED display screen comprises the steps: acquiring a to-be-detected image containing a target AMOLED display screen; extracting a target area image in the to-be-detected image;preprocessing the target area image to obtain a residual image; calculating a local maximum value point of the residual image through a Gaussian difference algorithm, and taking the local maximum value point as a seed point; and obtaining the defect position of the target AMOLED display screen according to the seed point and a preset threshold. Through the implementation of the defect detection method, the problem that in the prior art, the detection process of an AMOLED display screen is complex can be solved.

Description

technical field [0001] The invention relates to the technical field of display screens, in particular to a defect detection method, device, computer equipment and storage medium of an AMOLED display screen. Background technique [0002] In recent years, with the continuous improvement of social science and economic level, people's demand for electronic products has continued to increase, and display screens are an integral part of many electronic products, especially the new generation of AMOLED (Active Matrix Organic Light-Emitting Two Polar body, Active-matrix organic light-emitting diode) panel technology has received extensive attention. In the production process of AMOLED display, it is necessary to conduct quality inspection on AMOLED display to eliminate defects such as pinholes, scratches, particles, and mura in AMOLED display, and to achieve quality control of external AMOLED display. [0003] At present, the AOI (Automated Optical Inspection, Automated Optical Ins...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T5/00G06T7/11G06T5/30
CPCG06T7/0004G06T7/11G06T5/30G06T2207/30121G06T2207/10004G06T2207/20028G06T5/70
Inventor 肖君军刘强马昱刘彧尘周武超
Owner HARBIN INSTITUTE OF TECHNOLOGY SHENZHEN (INSTITUTE OF SCIENCE AND TECHNOLOGY INNOVATION HARBIN INSTITUTE OF TECHNOLOGY SHENZHEN)
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