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Non-contact nondestructive measurement system and method for surface type of highlight object

A measurement system and non-contact technology, applied in the direction of measuring devices, optical devices, instruments, etc., can solve problems such as spraying, impossibility, and difficult mechanical measurement methods, and achieve the effect of eliminating highly reflective areas and expanding the measurement field

Pending Publication Date: 2020-08-25
重庆市气象信息与技术保障中心
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

The mechanical measurement method is difficult to use in the industrial field due to its own limitations; although the surface spraying method can change the reflective properties of the object surface, it cannot or even cannot be sprayed on the surface of the object in many occasions

Method used

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  • Non-contact nondestructive measurement system and method for surface type of highlight object
  • Non-contact nondestructive measurement system and method for surface type of highlight object
  • Non-contact nondestructive measurement system and method for surface type of highlight object

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Embodiment

[0034] see Figure 1 to Figure 6, a non-contact non-destructive measurement system for high-gloss object surface, which includes a projection light source system, a polarizer, an image sensor, an image acquisition card and a computer; the polarizer includes a polarizer P1 and an analyzer P2, and its measurement system The projection system in is composed of a projection light source and a polarizer P1, and the imaging system in the measurement system is composed of an image sensor and a polarizer P2; the image sensor is an area array detector that receives a deformed grating image, and the image sensor receives The deformed grating image is transmitted to the computer by the image acquisition card to form a picture; the projected light source is an area array of natural light whose intensity is distributed sinusoidally, and the grating lines of the stripes are perpendicular to the reference plane.

[0035] The non-contact non-destructive measurement method of a high-gloss obje...

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Abstract

The invention discloses a non-contact nondestructive measurement system for the surface type of a highlight object. The non-contact nondestructive measurement system comprises a projection light source system, a polarizer, an image sensor, an image collection card and a computer, wherein the polarizer comprises a polarizer P1 and an analyzer P2, a projection system of the polarizer consists of a projection light source system and the polarizer P1, and an imaging system of the polarizer consists of an image sensor and the analyzer P2; the image sensor is an area array detector for receiving a deformed grating image; the projection light source is area array natural light with the intensity distributed in a sine mode, and grid lines of stripes are perpendicular to the reference plane. The invention further discloses a non-contact nondestructive measurement method for the surface type of the highlight object. According to the invention, starting from the polarization characteristic of a light field in Fourier transform profilometry; the measurement system and the measurement method for the surface type of the highlight object are provided by utilizing the filtering effect of an optical device polarizer and combining the existing Fourier transform profilometry and a Phong illumination model, and theoretical analysis and application results prove that mirror reflection light can influence the correct height distribution of a modulation light field.

Description

technical field [0001] The invention relates to the technical field of non-contact non-destructive measurement, in particular to a non-contact non-destructive measurement system and a measurement method of a high-gloss object surface. Background technique [0002] In the measurement work, non-destructive measurement is often performed on the surface of some high-gloss objects. The surface of such objects is relatively smooth. For example, the automobile manufacturing industry in modern industry requires high-precision non-destructive measurement on surfaces with specular reflection properties such as car bodies and polished molds. These There are not only diffuse reflection light but also specular reflection light in the reflected light of the object, which will lead to the high light of the measured object. There are two main sources of this part of the specular reflection light, one is the specular reflection caused by ambient light; the other is Specular reflections cause...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
CPCG01B11/2433
Inventor 陈利娟
Owner 重庆市气象信息与技术保障中心
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