A random static memory chip sram function test device

A technology of functional testing and static storage, applied in static storage, instruments, etc., can solve problems affecting the comprehensiveness of test data, achieve the effects of saving manpower, facilitating maintenance, and increasing comprehensiveness

CN111613263BActive Publication Date: 2021-05-07成都思科瑞微电子股份有限公司
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
Publication Date
2021-05-07

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Abstract

The invention discloses a random static memory chip SRAM function test device, specifically relates to the field of memory chips, comprising a main body shell, an inner tank is fixedly installed inside the main body shell, and an inner frame is arranged on one side of the inner tank. A circuit board is fixedly installed inside the liner, and a card slot is opened above the inner frame inside the liner. In the present invention, by arranging the inner frame, the semiconductor refrigerating sheet, the thermometer and the card slot, when the chip is tested, the tested chip is inserted into the slot from one side, and then the inner frame is pushed back into the inner tank, when the inner frame When fully entering the inner tank, start the electromagnet in the bottom groove, drive the clamping column to insert into the bottom groove for fixing, avoid being affected by the external environment during the test process, and start the upper semiconductor cooling chip to cool down when cooling is required, and By monitoring the temperature of the internal frame with a thermometer, the working performance of the chip at different temperatures can be tested, which increases the comprehensiveness of the test data.
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Description

technical field

[0001] The embodiment of the present invention relates to the field of memory chips, in particular to a random static memory chip SRAM function testing device. Background technique

[0002] Static random access memory is a type of random access memory. The so-called "static" means that as long as the memory is powered on, the data stored in it can be kept constantly.

[0003] The prior art has the following deficiencies: when the existing memory chip is tested, the test memory chip is in an exposed state, is easily affected by the external environment, and is in a normal temperature state during the test, and cannot understand the limit temperature of the working environment of the memory chip. Therefore, the working performance of the chip cannot be accurately tested. Contents of the invention

[0004] For this reason, the embodiment of the present invention provides a kind of random static memory chip SRAM functional testing device, when testing the chip...

Examples

Embodiment Construction

[0033] The implementation mode of the present invention is illustrated by specific specific examples below, and those who are familiar with this technology can easily understand other advantages and effects of the present invention from the contents disclosed in this description. Obviously, the described embodiments are a part of the present invention. , but not all examples. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0034] Refer to the attached Figure 1-4 , a random static memory chip SRAM functional testing device of this embodiment, comprising a main body shell 1, the inside of the main body shell 1 is fixedly installed with an inner liner 2, and one side of the inner liner 2 is provided with an inner frame 3, A circuit board 4 is fixedly installed inside the liner 2, and a card slot 31 is opened above t...