A random static memory chip sram function test device

Abstract

The invention discloses a random static memory chip SRAM function test device, specifically relates to the field of memory chips, comprising a main body shell, an inner tank is fixedly installed inside the main body shell, and an inner frame is arranged on one side of the inner tank. A circuit board is fixedly installed inside the liner, and a card slot is opened above the inner frame inside the liner. In the present invention, by arranging the inner frame, the semiconductor refrigerating sheet, the thermometer and the card slot, when the chip is tested, the tested chip is inserted into the slot from one side, and then the inner frame is pushed back into the inner tank, when the inner frame When fully entering the inner tank, start the electromagnet in the bottom groove, drive the clamping column to insert into the bottom groove for fixing, avoid being affected by the external environment during the test process, and start the upper semiconductor cooling chip to cool down when cooling is required, and By monitoring the temperature of the internal frame with a thermometer, the working performance of the chip at different temperatures can be tested, which increases the comprehensiveness of the test data.

Description

technical field [0001] The embodiment of the present invention relates to the field of memory chips, in particular to a random static memory chip SRAM function testing device. Background technique [0002] Static random access memory is a type of random access memory. The so-called "static" means that as long as the memory is powered on, the data stored in it can be kept constantly. [0003] The prior art has the following deficiencies: when the existing memory chip is tested, the test memory chip is in an exposed state, is easily affected by the external environment, and is in a normal temperature state during the test, and cannot understand the limit temperature of the working environment of the memory chip. Therefore, the working performance of the chip cannot be accurately tested. Contents of the invention [0004] For this reason, the embodiment of the present invention provides a kind of random static memory chip SRAM functional testing device, when testing the chip...

AI Technical Summary

Problems solved by technology

[0004] For this reason, the embodiment of the present invention provides a random static memory chip SRAM function testing device, through the inner frame, the semiconductor cooling chip, the thermometer and the card slot, when the chip is tested, the chip to be tested is inserted into the slot from one side Then push the inner frame back into the inner tank. When the inner frame is fully inserted into the inner tank, start the electromagnet in the bottom groove to drive the clamping post into the bottom groove for fixing, so as to avoid being affected by the external environment during the test. , when cooling is required, the upper semiconductor cooling chip is started to cool down, and the temperature of the inner frame is monitored through a thermometer, which can test the working performance of the chip at different temperatures, increasing the comprehensiveness of the test data, to solve the problems in the prior art Problems caused by being susceptible to external environmental interference affecting the comprehensiveness of test data

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