Naive Bayes-based fault diagnosis method, diagnosis equipment and storage medium

Abstract

The embodiment of the invention discloses a naive Bayes-based fault diagnosis method, which comprises the following steps of: carrying out principal component analysis on at least one working parameter of target equipment, and extracting at least one key parameter of which the contribution rate meets a preset condition from the at least one working parameter; according to the market maintenance information, obtaining at least one possible fault of the target equipment, a fault occurrence probability corresponding to the possible fault, a parameter exception probability of exception of each keyparameter and a conditional probability of exception of each key parameter when each possible fault occurs; constructing an improved naive Bayes fault diagnosis model according to the at least one parameter abnormality probability, the at least one fault occurrence probability and the conditional probability; and according to the improved naive Bayes fault diagnosis model, obtaining a target fault causing the current operation abnormality. The invention further discloses diagnosis equipment and a storage medium. The method can effectively improve the accuracy and reliability of a fault diagnosis result, and effectively improves the work efficiency of fault diagnosis.

Description

technical field [0001] The invention relates to the technical field of big data, in particular to a naive Bayesian-based fault diagnosis method, a diagnosis device and a storage medium. Background technique [0002] The equipment will fail during operation, resulting in failure to work, and the appearance of the same failure may correspond to many different causes, and the user cannot directly infer the root cause of the failure. If the method of checking one by one is used, time-consuming and labor-intensive, Even relying on expert experience to analyze the operation data of the faulty equipment, it is difficult to accurately investigate the cause of the fault, which seriously affects the normal operation of the equipment. Contents of the invention [0003] Based on this, it is necessary to propose a fault diagnosis method, diagnosis equipment and storage medium based on Naive Bayesian for the above-mentioned problems. [0004] A naive Bayesian-based fault diagnosis meth...

AI Technical Summary

Problems solved by technology

[0002] The equipment will fail during operation, resulting in failure to work, and the appearance of the same failure may correspond to many different causes, and the user cannot directly infer the root cause of the failure. If the method of checking one by one is used, time-consuming and labor-intensive, Even relying on expert experience to analyze the operation data of the faulty equipment, it is difficult to accurately investigate the cause of the fault, which seriously affects the normal operation of the equipment.

Images