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Dynamic temperature deformation measurement method and device in high-temperature environment

A dynamic measurement and deformation field technology, applied in the field of optical measurement, can solve the problems of affecting the accuracy of the temperature field, reducing the accuracy of the deformation field, and the inability to completely eliminate nonlinear brightness changes, so as to achieve the effect of eliminating the influence and measuring the deformation field with high precision.

Active Publication Date: 2020-09-29
TSINGHUA UNIV
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Problems solved by technology

[0003] In related technologies, it is possible to achieve insensitivity to linear changes in light intensity, or to reduce the influence of temperature changes on brightness, but the nonlinear brightness changes caused by radiation cannot be completely eliminated, which reduces the accuracy of deformation field measurement; at the same time, the external compensation is enhanced. Brightness to reduce the influence of temperature changes, which will affect the accuracy of temperature field measurement

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  • Dynamic temperature deformation measurement method and device in high-temperature environment
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[0055] Various exemplary embodiments, features, and aspects of the present disclosure will be described in detail below with reference to the accompanying drawings. The same reference numbers in the figures indicate functionally identical or similar elements. While various aspects of the embodiments are shown in drawings, the drawings are not necessarily drawn to scale unless specifically indicated.

[0056] The word "exemplary" is used exclusively herein to mean "serving as an example, embodiment, or illustration." Any embodiment described herein as "exemplary" is not necessarily to be construed as superior or better than other embodiments.

[0057] In addition, in order to better illustrate the present disclosure, numerous specific details are given in the following specific implementation manners. It will be understood by those skilled in the art that the present disclosure may be practiced without some of the specific details. In some instances, methods, means, componen...

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Abstract

The disclosure relates to a dynamic temperature deformation measurement method and device in a high-temperature environment. The method comprises the steps: acquiring a first image of the surface of ameasured object in a heating process and an initial image of the surface of the measured object when the measured object is not heated; correcting the initial image according to a first relational expression; obtaining a first deformation field of the measured object according to the corrected initial image and the first image; the first relational expression represents a brightness change relation of pixel points in the first image and the initial image. According to the invention, the method can eliminate the impact on the measurement of the deformation field from the nonlinear brightness change caused by radiation to realize the high-precision measurement of the deformation field.

Description

technical field [0001] The present disclosure relates to the technical field of optical measurement, in particular to a method, device and storage medium for dynamic measurement of temperature deformation in a high-temperature environment. Background technique [0002] In aerospace, gas turbine and other fields, when evaluating high-temperature structural materials, it is of great significance to overcome the influence of high-temperature environment on optical measurement, especially the influence of high-light radiation interference or even submersion of optical information. [0003] In related technologies, it is possible to achieve insensitivity to linear changes in light intensity, or to reduce the influence of temperature changes on brightness, but the nonlinear brightness changes caused by radiation cannot be completely eliminated, which reduces the accuracy of deformation field measurement; at the same time, the external compensation is enhanced. Brightness to reduce...

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Application Information

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IPC IPC(8): G01B11/16G01N25/20G01N21/25G01J5/60G06T5/00G06T7/00G06T7/90
CPCG01B11/16G01N25/20G01N21/251G01N21/255G01J5/60G06T7/0004G06T7/90G06T2207/10024G06T2207/10048G06T5/90
Inventor 冯雪岳孟坤张金松屈哲唐云龙
Owner TSINGHUA UNIV
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