A ccd-based automatic test system and its method

Abstract

The invention discloses a CCD-based automatic test system and its method. First, a test light source is selected according to the object to be tested, and the height of the object to be tested is adjusted; Test the reflected light on the object, and transmit the image information corresponding to the received reflected light to the computer, and the computer processes the received image to obtain the corresponding gray value distribution; obtain the maximum gray value according to the gray value distribution , the average gray value, and thereby obtain the first roughness and the second roughness representing the roughness range of the object to be tested; determine the position information of the object to be tested, and then transmit the detected position information to the display device. The invention can judge the location of the object to be tested with high accuracy, reduces the non-compensable error generated when the object to be tested is tested due to inaccurate positioning, and further improves the test accuracy of the object to be tested.

Description

technical field [0001] The invention relates to a CCD-based automatic testing system and a method thereof, belonging to the technical field of CCD testing. Background technique [0002] As we all know, the positioning of the test piece in the test of the test piece is a necessary step of the test. If the positioning is not accurate, the test of the test piece will produce irreparable errors, which greatly reduces the test accuracy. [0003] At present, the positioning of the test piece generally adopts the sensor fixed position test method and the image acquisition positioning method. The former uses a sensor to identify the position of the test piece, for example, uses an infrared sensor to measure the position of the test piece, but this method requires a sensor more, and the calculation is complicated, resulting in a long running time, which is not conducive to batch testing; the latter uses the image acquisition device to collect the position of the image, and obtains th...

AI Technical Summary

Problems solved by technology

[0003] At present, the positioning of the test piece generally adopts the sensor fixed position test method and the image acquisition positioning method. The former uses a sensor to identify the position of the test piece, for example, uses an infrared sensor to measure the position of the test piece, but this method requires more, and the calculation is complicated, resulting in a long running time, which is not conducive to batch testing; the latter uses the image acquisition device to collect the position of the image, and obtains the position information of the object to be tested through image contour extraction. The running time is short, but in the contour During the extraction process, the outline of the test piece is easily affected by the background image, resulting in low accuracy

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