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A vernier caliper with multi-stage amplification structure and high measurement accuracy

A technology for measuring accuracy and vernier calipers, which is applied in the field of mechanical processing, can solve the problems that the accuracy cannot be improved, the cost is increased, and the operation is complicated.

Active Publication Date: 2021-09-10
QINGDAO QINGTE ZHONGLI AXLE CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, the mechanical vernier caliper is the most commonly used and economical precision measuring tool in the processing industry, but the inspection accuracy of the mechanical vernier caliper is up to 0.02mm. Due to the limitation of its structural accuracy and the resolution of the alignment of the two engraved lines by the human eye, Its accuracy cannot be further improved. When facing the inspection requirements of higher-precision products, it cannot meet the inspection requirements of products with higher precision requirements. It can only rely on other higher-precision detection methods, resulting in increased costs and complicated operations.

Method used

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  • A vernier caliper with multi-stage amplification structure and high measurement accuracy
  • A vernier caliper with multi-stage amplification structure and high measurement accuracy
  • A vernier caliper with multi-stage amplification structure and high measurement accuracy

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Experimental program
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Effect test

Embodiment 1

[0028] (1) Analysis of principle of enlarged structure:

[0029] Parallelograms are unstable. When the size of each side is fixed, the points on each side move proportionally according to the fixed ratio during the graphic transformation process. The present invention utilizes this characteristic to design the amplification structure.

[0030] The analysis is as follows: such as figure 1 The initial position of the single-stage enlarged structure shown in the figure, BCDE in the figure is a parallelogram, point A is on the extension line of the DE line segment, O point is on the extension line of the DC line segment, and the connection points of each side are represented by ABCDEO, AD, DO The line segment is an indivisible whole, and the remaining line segments can rotate around their respective connection points. figure 2 The schematic diagram of the position of the single-stage enlarged structure shown in , the letters with "'" in the figure represent that the point has m...

Embodiment 2

[0062] Such as Figure 10 As shown, a multi-stage amplifying structure is composed of two stages of amplifying components, and each stage of the amplifying component includes a parallelogram structure composed of a pin shaft 1 and a connecting bar 2, and any two adjacent edges in the parallelogram structure An extension section is extended in the direction of the included angle, and the endpoints of the two extension sections and the diagonal endpoints of the included angle are on the same straight line, wherein, the endpoint of the extension section close to the second-stage amplification assembly in the first-stage amplification assembly and the second-stage amplification assembly are on the same straight line. The pin shaft 1 on the diagonal end point of the included angle of the secondary amplification component is flexibly connected, and the pin shaft 1 is flexibly connected to the end point of the other extension section, and the position of the pin shaft 1 is fixed; The...

Embodiment 3

[0064] Such as Figure 11 and Figure 12 As shown, a vernier caliper with high measurement accuracy includes the multi-stage enlarged structure 3 described in Embodiment 2, and also includes a main ruler 4, a front vernier ruler 5, a rear vernier ruler 6, a bayonet measuring head 7, a base plate 8 and The vernier base 9; wherein, the bottom and the front and rear sides of the main ruler 4 are slidably connected to the vernier base 9 with a groove structure, and the tops of the front and rear ends of the vernier base 9 are respectively passed through fastening pins 10 is equipped with a front vernier scale 5 and a rear vernier scale 6, the bottom surface of the front vernier scale 5 and the bottom surface of the rear vernier scale 6 are snapped on the top of the main scale 4; An inner cavity 11 is also provided, and a bottom plate 8 for closing the inner cavity is installed around the bottom opening of the inner cavity 11 through fastening pins 10. The inner cavity 11 is provi...

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Abstract

The invention belongs to the field of mechanical processing, and specifically relates to a vernier caliper with a multi-stage magnification structure and high measurement accuracy. A proportional magnification structure is designed according to the principle of a parallelogram, and the magnification structure is applied to a mechanical vernier caliper, while retaining the mechanical vernier caliper Under the premise of basic functions and inspection methods, its accuracy is greatly improved, and the accuracy of mechanical vernier calipers is raised to the micron level or higher to meet the inspection needs of high-precision products.

Description

technical field [0001] The invention belongs to the field of mechanical processing, and in particular relates to a vernier caliper with a multi-stage amplification structure and high measurement accuracy. Background technique [0002] At present, the mechanical vernier caliper is the most commonly used and economical precision measuring tool in the processing industry, but the inspection accuracy of the mechanical vernier caliper is up to 0.02mm. Due to the limitation of its structural accuracy and the resolution of the alignment of the two engraved lines by the human eye, Its accuracy cannot be further improved. When facing the inspection requirements of higher-precision products, it cannot meet the inspection requirements of products with higher precision requirements. It can only rely on other higher-precision detection methods, resulting in increased costs and complicated operations. . Contents of the invention [0003] According to the deficiencies in the prior art a...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B3/18
CPCG01B3/18
Inventor 杨朝会李林纪建奕纪彦斌吴恩泽刘明
Owner QINGDAO QINGTE ZHONGLI AXLE CO LTD