Closed-loop real-time simulation system based on synchronous parallel testing of multiple stability control devices

Abstract

The invention relates to a closed-loop real-time simulation system based on synchronous parallel testing of multiple stability control devices, and belongs to the technical field of safety and stability control devices. The closed-loop real-time simulation system comprises an RTDS model, a GTDO digital signal output board card, a GTDI digital signal input board card, a GTAO analog signal output board card, a power amplifier and other structures. According to the closed-loop real-time simulation system, the problems of high time consumption, low efficiency and non-visual comparison effect of aserial test scheme of a plurality of safety and stability control devices are solved; and the system can synchronously test devices of different manufacturers, greatly improves the test efficiency, reduces the wiring workload of the test system, is more visual in comparison, and is easy to popularize and apply.

Description

technical field [0001] The invention belongs to the technical field of testing safety and stability control devices, and in particular relates to a closed-loop real-time simulation system based on synchronous parallel testing of multiple stability control devices. Background technique [0002] Safety and stability control systems (devices) are widely used in power grids and play an important role as an important line of defense to ensure the safety and stability of power systems. At present, there are many manufacturers of safety and stability control systems, and the hardware configuration and software design ideas of the devices produced by each manufacturer are different. As a result, under the same fault condition, the devices of different manufacturers may have different action results. In order to ensure the stable operation of the power system, it is necessary to conduct comparison tests on the devices produced by various manufacturers to verify the correctness, sensi...

AI Technical Summary

Problems solved by technology

However, when there are many manufacturers or many test items to be tested, this serial test scheme is too time-consuming, and each time the test of a device is completed, the device must be removed from the test system before it can be connected. It is very cumbersome to disconnect the wiring frequently before inserting the next set of devices to be tested.

Since the tests of different manufacturers are not carried out at the same time, the comparison of the results after the test is not intuitive enough, and the efficiency is low

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