Adversarial sample generation method, system and device for outlier removal method
A technology against samples and outliers, applied in the field of image recognition, can solve problems such as poor robustness and inability to meet the precise classification requirements of fields with high security requirements, so as to improve confidence, robustness and classification accuracy Degree, the effect of meeting the accuracy requirements
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[0047] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, not to limit the invention. It should also be noted that, for the convenience of description, only the parts related to the related invention are shown in the drawings.
[0048] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.
[0049] The present invention provides a method for generating an adversarial sample for an outlier removal method. The method includes:
[0050] Step S100, acquiring 3D point cloud data with category labels;
[0051] Step S200, input the 3D point cloud data into the 3D point cloud ...
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