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Adversarial sample generation method, system and device for outlier removal method

A technology against samples and outliers, applied in the field of image recognition, can solve problems such as poor robustness and inability to meet the precise classification requirements of fields with high security requirements, so as to improve confidence, robustness and classification accuracy Degree, the effect of meeting the accuracy requirements

Active Publication Date: 2020-11-10
INST OF AUTOMATION CHINESE ACAD OF SCI
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Problems solved by technology

[0004] In order to solve the above-mentioned problems in the prior art, the existing image classification model based on deep learning adopts conventional adversarial examples for training, which has poor robustness and cannot meet the precise classification requirements in fields with extremely high security requirements. Problem, the present invention provides an adversarial sample generation method for the outlier removal method, the method includes:

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[0047] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, not to limit the invention. It should also be noted that, for the convenience of description, only the parts related to the related invention are shown in the drawings.

[0048] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0049] The present invention provides a method for generating an adversarial sample for an outlier removal method. The method includes:

[0050] Step S100, acquiring 3D point cloud data with category labels;

[0051] Step S200, input the 3D point cloud data into the 3D point cloud ...

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Abstract

The invention belongs to the field of image recognition, particularly relates to an adversarial sample generation method, system and device for an outlier removal method, and aims to solve the problems that an adversarial sample adopted by existing classification model training based on deep learning cannot make an image classification error under an outlier removal method; and therefore, the trained classification model is poor in robustness and low in accuracy. The method comprises the following steps: acquiring a training data set with category labels, inputting three-dimensional point cloud data into a classification model, calculating classification loss, respectively calculating the gradient of the classification loss relative to the three-dimensional point cloud data and the gradient of the classification loss relative to outlier-removed three-dimensional point cloud data, and fusing the two gradients by multiplying a scaling factor to generate fusion disturbance, and applying the fusion disturbance to the three-dimensional point cloud data for repeated iteration to generate an adversarial sample. The generated adversarial samples can still cause image classification errorsunder the condition that outliers are removed, and the robustness and classification accuracy of the trained model are improved.

Description

technical field [0001] The invention belongs to the field of image recognition, and in particular relates to an adversarial sample generation method, system and device for outlier removal methods. Background technique [0002] The 3D point cloud classification model based on deep learning has been greatly developed in recent years, and can achieve a classification accuracy of about 90% on the ModelNet40 dataset. But at the same time, in the field of image classification, the classification model based on deep learning is vulnerable to the attack of adversarial samples. From the appearance, the adversarial samples are almost the same as the normal samples, but the adversarial samples will make the classification model make mistakes. However, there are few studies on adversarial examples in the field of 3D point cloud, and the field of 3D point cloud classification is related to engineering projects with high security requirements such as automatic driving and machine grasping...

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Application Information

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IPC IPC(8): G06K9/62G06K9/40
CPCG06V10/30G06F18/24G06F18/214
Inventor 马成丞孟维亮徐士彪郭建伟吴保元张晓鹏
Owner INST OF AUTOMATION CHINESE ACAD OF SCI
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