PCIE signal test fixture and data path gating test system thereof
A data path and test system technology, applied in digital transmission systems, transmission systems, data exchange networks, etc., can solve the problems of easily damaged connector joints, serious time-consuming restart of boards, frequent plugging and unplugging, etc.
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[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0025] Please refer to figure 1 , figure 1 It is a schematic diagram of the overall structure of a specific embodiment provided by the present invention.
[0026] In a specific embodiment provided by the present invention, the data path gating test system mainly includes a gold finger 1, a P-type line gating module 2, an N-type line gating module 3, a gating switching module 4 and a connector pair 5 .
[0027] Among them, the gold finger 1 is mainly used to...
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