7results about How to "Simplify the test operation process" patented technology

The invention provides a single-electrode silica gel sheet test circuit, device and method for physical therapy. The single-electrode silica gel sheet test circuit comprises a microcontroller, a Darlington tube array chip circuit, a relay array, a signal conditioning circuit and the like. The microcontroller controls the Darlington array to amplify low-power signals, drives the relay array to achieve selection of different test paths, collects and processes test data, and transmits the test data to the computer through a serial port. The relay array alternately switches paths to complete each test item; the signal conditioning circuit is used for adjusting a test signal to meet the AD sampling requirement; the digital control analog switch realizes multiplexing of multiple paths of signals, and a single AD port acquires multiple paths of signals; and the state indicating circuit displays the test result and gives an alarm prompt. The system is specially used for a single electrode plate test scheme, the installation complexity can be remarkably reduced, the stability is improved, and the efficiency is greatly improved.

The application belongs to the field of material and electronic device mechanical test, and particularly relates to a dynamic mechanical response test device and method of a circuit board under impact. The device comprises a free Hopkinson bar impact unit, which comprises an incident bar, one end of the incident bar being a striking end and the other end being a non-striking end; a mounting base, the mounting base being fixed to the non-striking end of the incident bar, and a circuit board to be tested being detachably fixed on the mounting base; a strain measurement unit, the strain measurement unit comprising three groups of strain gauges; a laser Doppler velocimeter, the measuring point of the laser Doppler velocimeter being switchably arranged on the surface center region of the mounting base or the surface of the circuit board to be tested; and a data processing unit, the data processing unit being electrically connected with the strain measurement unit and the laser Doppler velocimeter respectively, and being used for receiving strain signals and dynamic response signals.

The invention provides a comprehensive testing method and device for an agricultural machine microcontroller and a storage medium, and relates to the technical field of microcontroller testing. The method comprises the steps of firstly building a bidirectional data transmission link with a microcontroller to be tested, then converting a user test demand into a corresponding test instruction, issuing the test instruction, collecting original test data after a test is executed, carrying out standardization processing on the original data, evaluating a test state, if a result is abnormal, creating a correction response flow according to an abnormal type, and if the result is abnormal, completing the test. Re-establishing a link or evaluating to obtain a new result; according to the invention, automation and integration of the whole testing process are realized through a closed-loop process, a splitting link is not needed, manual equipment switching is not needed, comprehensive testing is completed in a one-stop manner, operation is greatly simplified, and efficiency is improved; the abnormality correction mechanism can optimize the process automatically, avoids test interruption, guarantees test continuity and reliability, and provides an efficient and stable solution for factory detection and regular maintenance of the agricultural machine microcontroller.

This invention provides a clamping test machine, including a base; a control cabinet is installed at one end of the base; a lifting channel steel rail is installed on the base and located near the control cabinet, with recessed track grooves on opposite sides inside; a lifting assembly is installed inside the lifting channel steel rail and driven to move up and down by a lifting hydraulic cylinder; a relative motion assembly is installed on the lifting assembly, forming a space to accommodate the test piece within the relative motion assembly; a pair of pressure plates are provided, respectively installed on side support plates within the relative motion assembly. This invention uses the lifting assembly installed in the lifting channel steel rail on the base to drive the relative motion assembly to meet the height requirements of the product to be tested. The clamping strength of the pressure plates driven by the relative motion assembly simulates the environmental pressure experienced during transportation, adapting to the clamping requirements of various products. The product is easy to install, the test operation is simple, and it facilitates rapid testing.

The utility model relates to a pulse test circuit for a gamma probe. The pulse test circuit comprises a power supply module, a signal conversion module and a signal processing module, the power supply module is used for converting an alternating-current power supply into a + 5V direct-current power supply and converting the + 5V direct-current power supply into a + 3.3 V direct-current power supply; the signal conversion module is used for filtering the gamma pulse signal through a comparator and isolating the gamma pulse signal through a photoelectric coupler to generate a current pulser signal; the signal processing module is used for collecting the current pulse signal generated by the signal conversion module into the single-chip microcomputer to calculate a gamma value. A stable direct-current power source can be provided for the gamma probe, gamma pulse signals are collected while the gamma probe works normally, accumulation calculation of the gamma pulse signals is carried out, compared with a traditional gamma probe testing mode, the gamma value can be detected without a ground system, a directional probe and a PC end serving as necessary testing equipment, testing equipment is simplified, and the testing efficiency is improved. And the test operation process is simplified, and the test convenience is greatly improved.

The invention discloses a reverberation chamber calibration method and calibration system, and belongs to the technical field of automotive electronic EMC testing, and the method comprises the steps: obtaining normalized field intensity data through a probe method under the condition of no load of a reverberation chamber, and storing the normalized field intensity data for later use; s21 data are collected through a network division method and stored for standby application; under the reverberation chamber loading condition, S21 data are collected through a network division method; on the basis of the S21 data under the no-load condition and in combination with the S21 data under the loading condition, the reverberation chamber loading coefficient under each test frequency point is calculated; and calculating the input power of the reverberation chamber under the target field intensity under each test frequency point by combining the loading coefficient of the reverberation chamber based on the normalized field intensity data obtained by the probe method. According to the invention, the testing operation steps are simplified, and the testing time is greatly reduced, so that the working efficiency can be remarkably improved, and the quick calibration of the reverberation room site can be realized.

The present invention discloses a method, device, medium and product for multi-core chip verification. The method includes: designing a multi-core architecture for managing multi-core operation; based on the designed multi-core architecture, creating UART tasks, command processing tasks and queues, and designing a multi-core verification command menu based on a serial port; the UART task receives and parses the serial port command for multi-core verification, and sends the command to a designated core through a queue according to the parsing result; the designated core executes the command processing task and calls a test case. The present invention reduces the complexity and resource consumption in the verification process and improves the efficiency and flexibility of verification by designing a streamlined multi-core architecture and performing multi-core command selection based on a serial port.