Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Capacitance error measurement circuit, measurement method, chip and household electrical appliance

A technology of error measurement and capacitance, which is applied in the fields of chips and household appliances, measurement methods, capacitance error measurement circuits, and can solve the problems of capacitance ratio error, bridge capacitance increase error, etc.

Active Publication Date: 2020-11-24
MR SEMICONDUCTOR LTD
View PDF8 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the deviation of the production process, there is a certain error in the capacitance ratio, and the bridge capacitor increases this error.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Capacitance error measurement circuit, measurement method, chip and household electrical appliance
  • Capacitance error measurement circuit, measurement method, chip and household electrical appliance
  • Capacitance error measurement circuit, measurement method, chip and household electrical appliance

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0027] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It should be understood that the specific embodiments described here are only used to explain the present application, but not to limit the present application. In addition, it should be noted that, for the convenience of description, only some structures related to the present application are shown in the drawings but not all structures. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of this application.

[0028] The terms "first", "second", etc. in this application are used to distinguish different objects, not to describe a specific order. Furthermore, the terms "include" and "have", as well as any variations thereof, are intended to cover a non-e...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention discloses a capacitance error measurement circuit, a measurement method, a chip and a household electrical appliance, the capacitance error measurement circuit comprising: a comparator, the first input end of which is configured to input an analog signal and the second input end of which is connected to a correction signal line and is configured to input a correction signal;a first capacitor matrix which comprises a plurality of first capacitors, wherein one ends of the plurality of first capacitors are connected with the correction signal line, and the other end of at least one first capacitor is configured to receive a reference signal and input a correction signal to the correction signal line; a second capacitance matrix, wherein one end of the second capacitancematrix is connected with the correction signal line, and the other end of the second capacitance matrix is configured to receive the reference signal, change the total capacitance value of the secondcapacitance matrix and adjust the correction signal; and a controller which is connected with the output end of the comparator and the second capacitor matrix, and is configured to determine the total capacitance value of the second capacitor matrix when the output signal of the comparator is reversed, and determine the error of the capacitor to be measured according to the total capacitance value. In this way, capacitance error measurement can be achieved.

Description

technical field [0001] The present application relates to the technical field of capacitance error measurement, in particular to a capacitance error measurement circuit, a measurement method, a chip and household appliances. Background technique [0002] SAR ADC (successive approximation register analog to digital converter, successive approximation analog-to-digital converter) is a commonly used data converter with a medium sampling rate (up to about 15MSPS) and medium resolution (up to about 18 bits). These structures are efficient and easy to understand. Unlike pipelined ADCs, the SAR architecture has no latency. The relatively high sampling rate and zero latency make SAR ADCs suitable for multiplexed data acquisition. [0003] Because of its high speed, high precision and low power consumption, SAR ADC has been widely used in industry. In order to reduce power consumption, modern SAR ADCs use a capacitor matrix structure. In order to reduce the area of ​​the capacito...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R27/26
CPCG01R27/2605
Inventor 林建清
Owner MR SEMICONDUCTOR LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products