Preparation method of micromechanical equipment

A pair, wafer technology, applied in the field of micromechanical equipment preparation, can solve the problems of high cost of getter preparation, high parasitic capacitance, and insufficient anti-turbulence and firmness of inertial sensors.

Pending Publication Date: 2020-12-18
QST CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there are many difficulties in the current preparation process that are worthy of improvement and progress: such as excessive parasitic capacitance caused by insulating vias, insufficient anti-bump and firmness in the field of inertial sensors, high preparation costs using getters, etc.

Method used

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  • Preparation method of micromechanical equipment
  • Preparation method of micromechanical equipment
  • Preparation method of micromechanical equipment

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Embodiment Construction

[0024] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0025] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.

[0026] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, but not as a limitation of the present invention.

[0027] In view of the above-mentioned problems existing in the prior art, a preparation method of a micromechani...

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Abstract

The invention provides a preparation method of micromechanical equipment, which comprises the following steps of: bonding an MEMS wafer with a sealing cover surface, punching, etching, bonding with athrough hole surface, and anchoring the MEMS wafer serving as a device layer between two sides to provide higher rigidity for a corresponding mold. Meanwhile, thinning is conducted in the preparationprocess, jolt can be relieved and the requirement for getter can be eliminated through a small gap and / or a more controllable gap between the getter and the substrate, and the preparation cost is reduced.

Description

technical field [0001] The invention relates to the field of micromechanical device preparation, in particular to a method for preparing a micromechanical device. Background technique [0002] With the rapid development of modern electronic technology, various electronic devices such as navigation systems, cellular phones, and electronic games require sensors that can accurately determine the motion of the device at low cost with a small form factor. Conventional techniques have been developed to bump microelectromechanical systems (MEMS) chips on ASIC wafers or to integrate MEMS with ASIC wafers. However, there are many difficulties in the current preparation process that are worthy of improvement and progress: such as excessive parasitic capacitance caused by insulating vias, insufficient anti-bump and firmness in the field of inertial sensors, and high preparation costs using getters, etc. Therefore, there is an urgent need for a new preparation process to further reduce...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B81C1/00B81B7/04
CPCB81C1/00269B81B7/04B81C2201/019
Inventor 戴维·L·马克斯森克·阿卡尔
Owner QST CORP
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