Unlock instant, AI-driven research and patent intelligence for your innovation.
A preparation method of a special sample for a three-dimensional nanometer x-ray microscope
What is Al technical title?
Al technical title is built by PatSnap Al team. It summarizes the technical point description of the patent document.
A three-dimensional nano- and X-ray technology, which is applied in the field of X-ray imaging, can solve the problems of large influence of sample edge ablation, high technical threshold, difficult sample preparation, etc., and achieves the effect of simple, quick and easy operation.
Active Publication Date: 2021-09-24
INST OF METAL RESEARCH - CHINESE ACAD OF SCI
View PDF8 Cites 0 Cited by
Summary
Abstract
Description
Claims
Application Information
AI Technical Summary
This helps you quickly interpret patents by identifying the three key elements:
Problems solved by technology
Method used
Benefits of technology
Problems solved by technology
Equipped with a scanning electron microscope and a focused ion beam system for micro-nano processing, the instrument is expensive and has a high technical threshold, requiring professional and technical personnel to operate
The nanosecond laser processing system, in addition to the high price of the instrument, is not easy to obtain, the ablation area at the edge of the sample has a great influence, it is difficult to prepare samples with a diameter of less than 35 microns, and it is not suitable for samples with low melting points
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more
Image
Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
Click on the blue label to locate the original text in one second.
Reading with bidirectional positioning of images and text.
Smart Image
Examples
Experimental program
Comparison scheme
Effect test
Embodiment 1
[0031] In this example, brittle, non-conductive and difficult-to-process SiC ceramics are selected for special sample preparation for three-dimensional nano-X-ray microscopy, and the steps are as follows:
[0032] Step 1: First, use the cold mounting method to inlay the sample, and after standing for 24 hours, cut the inlaid sample with a diamond saw to prepare an initial sample with a thickness of 1mm.
[0033] Step 2: Choose different types of diamond sandpaper to polish the initial samples obtained in step 1 in sequence. The type of sandpaper is selected in order of 200#, 400#, 800#, 1200# and 2000#, and the surface roughness of the sample is polished to 2 microns.
[0034] Step 3: After completing step 2, treat the cold-mounted sample with acetone to remove the mounting material and keep the target sample. The surface size of the sample with irregular edges is about 5 mm x 5 mm, and the thickness is about 30 microns.
[0035] Step 4: Choose a blade with high sharpness, t...
Embodiment 2
[0043] In this example, GCr15 bearing steel is selected for three-dimensional nano X-ray microscope special sample preparation, the steps are as follows:
[0044] Step 1: Firstly, a sheet-shaped initial sample with a thickness of about 1.5 mm is cut from a square block of GCr15 bearing steel by wire electric discharge cutting method.
[0045] Step 2: Choose different types of diamond sandpaper to polish the initial samples obtained in step 1 in sequence. The type of sandpaper is selected in order of 200#, 400#, 800#, 1200#, 2000# and 3500#, and the surface roughness of the sample is polished to 0.5 microns.
[0046] Step 3: After step 2 is completed, the size of the square sample is about 7mm×7mm, and the thickness is about 10 microns.
[0047] Step 4: Choose a blade with high sharpness, that is, choose such as figure 2 As shown in (a), the blade with such an edge shape meets the requirements for use and can cut out straight edges.
[0048] And as figure 2 As shown in (b...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More
PUM
Property
Measurement
Unit
thickness
aaaaa
aaaaa
thickness
aaaaa
aaaaa
thickness
aaaaa
aaaaa
Login to View More
Abstract
The invention belongs to the technical field of X-ray imaging, and in particular relates to a method for preparing a special sample for a three-dimensional nanometer X-ray microscope. The method includes the following steps: selecting a preliminary processing method to prepare an initial sample; selecting sandpaper according to the hardness of the material, and grinding the initial sample to a roughness of less than 3 microns; selecting a blade with high sharpness, whose edge shape is a straight line, and can cut straightness On the good side, take the two-knife method on the initial sample to cut the sharp corner sample; choose quick-drying glue, stick the sharp corner sample to the end of a pin or similar metal rod, and place it for 24 hours. Three-dimensional imaging tests of different ratios and different contrasts. The invention can greatly reduce the difficulty of sample preparation and meet the requirement of 50nm spatial resolution three-dimensional imaging of different materials. Use 3D nano-X-ray microscopy to obtain more structural information inside multi-scale heterogeneous materials such as metals, ceramics and composite materials.
Description
technical field [0001] The invention belongs to the technical field of X-ray imaging, and in particular relates to a method for preparing a special sample for a three-dimensional nanometer X-ray microscope. Background technique [0002] In recent years, with the rapid development of X-ray tubes, X-ray optical devices and computer systems, X-ray imaging technology has been rapidly improved. X-ray 3D imaging technology is widely used in various fields such as material science, mineral analysis, life science, electronic devices and archaeology. By revealing the heterogeneous information of the subsurface and interior of materials or devices, such as: three-dimensional spatial distribution and quantitative information of pores, cracks, segregation, inclusions, second phases, and multi-level construction phases, the composition-structure-performance or service The relationship between performance has strongly promoted the development of various disciplines. At present, the spat...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More
Application Information
Patent Timeline
Application Date:The date an application was filed.
Publication Date:The date a patent or application was officially published.
First Publication Date:The earliest publication date of a patent with the same application number.
Issue Date:Publication date of the patent grant document.
PCT Entry Date:The Entry date of PCT National Phase.
Estimated Expiry Date:The statutory expiry date of a patent right according to the Patent Law, and it is the longest term of protection that the patent right can achieve without the termination of the patent right due to other reasons(Term extension factor has been taken into account ).
Invalid Date:Actual expiry date is based on effective date or publication date of legal transaction data of invalid patent.
Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/28
CPCG01N1/28G01N1/286G01N2001/2866G01N2001/2873
Inventor 王绍钢李长记张磊
Owner INST OF METAL RESEARCH - CHINESE ACAD OF SCI
Login to View More