Voltage sag event normalization method based on waveform characteristics
Patent Information
- Authority / Receiving Office
- CN ยท China
- Current Assignee / Owner
- SICHUAN UNIV
- Publication Date
- 2020-12-22
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Abstract
Description
technical field
[0001] The invention belongs to the technical field of voltage sag events, and in particular relates to a voltage sag event normalization method based on waveform characteristics. Background technique
[0002] Analyzing voltage sag monitoring data is the basis for understanding and managing voltage sag problems. Whether it is to trace the cause or location of the sag, or to evaluate the sag event, it is first necessary to perform normalized identification of the sag event, that is, to clarify the sag event recorded by a large number of power quality monitoring devices in the power grid , which events are caused by the same fault. If the normalization result of the slump event is wrong, it may affect the subsequent analysis results, such as overestimation or underestimation of the sag evaluation result. However, the traditional method usually identifies the occurrence time of the sag event recorded by the monitoring device, and considers that the sag event o...