Method and device for calculating signal-to-noise ratio from oscillogram and checking noise intensity

Abstract

The invention discloses a method and device for calculating a signal-to-noise ratio from an oscillogram and checking noise intensity, and the method comprises the steps: denoising an original waveformof a signal obtained by an oscilloscope through calling an image processing module of Python, and calculating the signal-to-noise ratio of a measured signal; with steps of denoising the signal, searching similar areas in an image by taking an image block in a whole signal oscillogram obtained by an oscilloscope as a unit, averaging the areas and removing noises in the image; processing signal-to-noise ratio: comparing the denoised signal oscillogram with an original signal oscillogram obtained by an oscilloscope, and calculating the signal-to-noise ratio so as to judge the influence of noiseon the signal; and processing signal batch: carrying out above two steps of processing on other signals in the signal oscillogram to obtain different PSNR results, and obtaining an average range of asignal-to-noise ratio based on the plurality of PSNR results. The original signal waveform obtained in the oscilloscope can be denoised and then compared with the original signal, the signal-to-noiseratio is calculated, and therefore the noise intensity is judged.

Description

technical field [0001] The invention relates to the field of cross-platform computer programming language, in particular to a method and device for calculating the signal-to-noise ratio and checking the noise intensity from a waveform diagram. Background technique [0002] Python is a cross-platform computer programming language. It is a high-level scripting language that combines interpretability, compilation, interactivity and object-oriented. It can complete various advanced tasks. Welcome, a computer programming language that also has a wide range of applications. In the field of engineering, for hardware engineers, HW testing is essential. While seeing the specific signal waveform, it can also indirectly measure the performance of the board. Usually, the oscilloscope used in HW test can display signal waveform, high and low level values, maximum and minimum values, and time period and other parameters. However, some signals will be affected by noise. Noise refers to i...

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Problems solved by technology

[0004] 1. The waveform that passes the test may be interfered by the noise signal, and the noise signal will not be used as an indicator of the test failure during the test, but it will affect the quality of the signal and the performance of the board

[0005] 2. For the case of too many test cases, batch processing cannot be done

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