Particle detector having improved performance and service life

A detector and particle technology, applied in the field of ion detectors, can solve the problems of delaying the implementation of new detectors, spending time and energy, etc.

Pending Publication Date: 2020-12-29
艾德特斯解决方案有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

While effective, this approach costs time and effort, and delays the implementation of new detectors

Method used

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  • Particle detector having improved performance and service life
  • Particle detector having improved performance and service life
  • Particle detector having improved performance and service life

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Embodiment Construction

[0100] After considering this description it will be apparent to a person skilled in the art how to implement the invention in various alternative embodiments and alternative applications. However, while various embodiments of the invention will be described herein, it is to be understood that these embodiments are presented by way of example only, and not limitation. Accordingly, this description of various alternative embodiments should not be construed as limiting the scope or breadth of the present invention. Furthermore, statements of advantages or other aspects apply to particular exemplary embodiments and not necessarily to all embodiments covered by the claims.

[0101] Throughout the description and claims of this specification, the word "comprise" and variations of the word, such as "comprising" and "comprising", are not intended to exclude other additives, components, integers or steps.

[0102] Reference throughout this specification to "one embodiment" or "an emb...

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Abstract

The present invention relates to generally to components of scientific analytical equipment. More particularly, the invention relates to ion detectors of the type which incorporate electron multipliers and modifications thereto for extending the operational lifetime or otherwise improving performance. The invention may be embodied in the form of a particle detector having one or more electron emissive surfaces and / or an electron collector surface therein, the particle detector being configured such that in operation the environment about the electron emissive surface(s) and / or the electron collector surface is / are different to the environment immediately external to the detector.

Description

technical field [0001] The present invention generally relates to components of scientific analysis equipment. More particularly, the present invention relates to an ion detector incorporating an electron multiplier and modifications thereof to extend operating life or otherwise improve performance. Background technique [0002] In a mass spectrometer, analytes are ionized to form a series of charged particles (ions). The resulting ions are then separated according to their mass-to-charge ratios, typically by acceleration and exposure to electric or magnetic fields. The separated signal ions impinge on the surface of the ion detector to generate one or more secondary electrons. Results are displayed as spectra of the relative abundance of the detected ions as a function of mass-to-charge ratio. [0003] In other applications, the particles to be detected may not be ions, but may be neutral atoms, neutral molecules or electrons. In any case, the detector surface on which ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/26G01N23/00
CPCH01J43/10H01J47/005H01J49/025H01J49/26H01J43/18H01J49/288H01J43/28H01J47/002
Inventor R·尤雷克K·宏特
Owner 艾德特斯解决方案有限公司
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