Semiconductor device detection method and device, intelligent terminal and storage medium
A detection method and technology of a detection device, which are applied to instruments, image data processing, calculation, etc., can solve the problems of low accuracy of detection results, achieve accurate and reliable detection results, and reduce the effect of printed content.
Pending Publication Date: 2021-01-05
罗建华
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[0005] Aiming at the problem of low accuracy of semiconductor device detection results caused by directly scanning and analyzing the surface of semiconductor devices in the prior art, the present invention provides a semiconductor device detection method, device, intelligent terminal and storage medium, which can obtain semiconductor device The color image of the device is processed and the target image of at least two different color channels is obtained, and image feature analysis and judgment are performed based on each target image to obtain the detection result of the semiconductor device
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[0050] In the following description, specific details such as specific system structures and technologies are presented for the purpose of illustration rather than limitation, so as to thoroughly understand the embodiments of the present invention. It will be apparent, however, to one skilled in the art that the invention may be practiced in other embodiments without these specific details. In other instances, detailed descriptions of well-known systems, devices, circuits, and methods are omitted so as not to obscure the description of the present invention with unnecessary detail.
[0051] It should be understood that when used in this specification and the appended claims, the term "comprising" indicates the presence of described features, integers, steps, operations, elements and / or components, but does not exclude one or more other features. , whole, step, operation, element, component and / or the presence or addition of a collection thereof.
[0052] It should also be und...
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The invention discloses a semiconductor device detection method and device, an intelligent terminal and a storage medium, and the method comprises the steps: obtaining a color image of a semiconductordevice; processing the color image to obtain target images of at least two different color channels; carrying out image feature analysis based on each target image, comparing and judging with a preset feature detection standard, and obtaining a detection result of the semiconductor device in combination with a judgment result of each target image; and outputting the detection result. According tothe scheme, the color image of the semiconductor device is divided into the target images of the plurality of color channels and is analyzed and judged respectively, and the detection result of the semiconductor device is obtained in combination with the judgment result under each color channel. Therefore, the scheme of the invention can effectively reduce the influence of factors such as the environment and the printing content on the semiconductor device, so that the detection result is more accurate and credible.
Description
technical field [0001] The present invention relates to the technical field of semiconductor device defect detection, in particular to a semiconductor device detection method, device, intelligent terminal and storage medium. Background technique [0002] With the development of science and technology, research on semiconductor technology has gradually matured, and semiconductor devices have been more and more widely used. During the production and transportation of semiconductor devices, defects such as chip shedding, chip tilting, broken wires, and missing soldering may occur. In the process of use, the quality of semiconductor devices must be strictly controlled to reduce the defect rate of semiconductor devices. Therefore, it is necessary to perform defect detection on semiconductor devices to screen defective semiconductor devices. [0003] In the prior art, the surface of the semiconductor device is usually scanned by a defect detection machine, and the defect detectio...
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CPCG06T7/0006G06T2207/10024G06T2207/30148
Inventor 罗建华
Owner 罗建华