Unlock instant, AI-driven research and patent intelligence for your innovation.

Rapid self-correction method for projection grating in phase measurement profilometry

A phase measurement profile and self-correction technology, applied in the field of computer vision, can solve problems such as high measurement accuracy, and achieve the effect of improving accuracy

Active Publication Date: 2021-01-15
GUILIN UNIV OF ELECTRONIC TECH
View PDF17 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is a technical problem existing in the prior art that greatly affects the measurement accuracy

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Rapid self-correction method for projection grating in phase measurement profilometry
  • Rapid self-correction method for projection grating in phase measurement profilometry
  • Rapid self-correction method for projection grating in phase measurement profilometry

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0043] This embodiment provides a fast self-calibration method for projected gratings in phase measurement profilometry. Before the grating output of the projector, the correction method includes:

[0044] Step 1: For the projection interface, use the grating formula to calculate the boundary peak point as the first calibration point; calculate the upper and lower boundaries of the grating and the fringe peak line with reference to the plane distortion grating, and extract and calculate the boundary peak point as the second calibration point through the intersection line;

[0045] Step 2, calculating the transformation matrix H between the projection plane and the reference plane according to the first calibration point and the second calibration point;

[0046] In step three, the effective area of ​​the reference plane is set as a standard sinusoidal grating, and combined with the transformation matrix H in step two, the projected grating image is inversely solved to complete ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a rapid self-correction method of a projection grating in phase measurement profilometry, which solves the technical problem that the measurement precision is influenced. Themethod comprises the following steps of 1, calculating a boundary peak point as a first calibration point by using a grating formula according to a projection interface; calculating upper and lower boundaries and a stripe peak line of the grating by referring to the plane distortion grating, and extracting and calculating a boundary peak point as a second calibration point through an intersectionline; 2, calculating a transformation matrix H of the projection plane and the reference plane according to the first calibration point and the second calibration point; and 3, setting an effective area of the reference plane as a standard sinusoidal grating, and inversely solving a projection grating image by combining the transformation matrix H in the step 2 to finish correction, so a problem is better solved, and the method can be used for phase measurement.

Description

technical field [0001] The invention relates to the field of computer vision, in particular to a fast self-correction method for projection gratings in phase measurement profilometry. Background technique [0002] Phase Measurement Profilometry (PMP) with digital grating projection is one of the most widely used full-field 3D profilometry techniques due to its non-contact, low cost, easy acquisition, easy handling, and high resolution. The grating projection phase measurement profilometry can be specifically described as: the prepared grating fringes are projected onto the surface of the measured object through a digital projector, and the deformed fringes are generated after being modulated by the measured object. The camera collects the deformed fringes and transmits them to the computer. The phase distribution is obtained by solving the phase, which is substituted into the phase information-geometric information relational expression to obtain a three-dimensional geometri...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24G01B11/25
CPCG01B11/2433G01B11/254
Inventor 马峻葛旭文
Owner GUILIN UNIV OF ELECTRONIC TECH