Method, device, system and computer storage medium for measuring deflection rate of galvanometer
A measurement method and deflection rate technology, which is applied in the field of systems and computer storage media, devices, and deflection rate measurement methods, can solve the problems of low detection efficiency of galvanometers, achieve accurate detection results, and improve detection efficiency
Active Publication Date: 2022-07-22
GOERTEK OPTICAL TECH CO LTD
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Problems solved by technology
The deflection effect of the galvanometer is generally observed by the tester with the naked eye, and judge whether the deflection effect is qualified based on experience, which makes the detection efficiency of the galvanometer low
Method used
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[0044] It should be understood that the specific embodiments described herein are only used to explain the present invention, but not to limit the present invention.
[0045] The embodiment of the present invention provides a solution. The deflection of the image is calculated through the projection image when the galvanometer is deflected and the projection image when the galvanometer is not deflected, and then the deflection rate of the galvanometer is determined. It can be known whether the deflection effect of the galvanometer is qualified, and the tester does not need to observe with the naked eye, which improves the detection efficiency of the galvanometer, and the detection result is more accurate.
[0046] like figure 1 shown, figure 1 It is a schematic diagram of the terminal structure of the hardware operating environment involved in the solution of the embodiment of the present invention.
[0047] The terminal in the embodiment of the present invention is a termin...
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The invention discloses a method for measuring the deflection rate of a galvanometer mirror. The method for measuring the deflection rate of a galvanometer mirror comprises: acquiring a first projection image projected by the projector when the galvanometer mirror of the projector is deflected; The second projection image projected by the projector when the mirror is not deflected; the image offset is determined according to the first projection image and the second projection image; the deflection rate of the galvanometer is obtained according to the image offset . The invention also discloses a measuring device, a system and a computer storage medium for the deflection rate of the galvanometer. Through the projection image when the galvanometer is deflected and the projection image when the galvanometer is not deflected, the offset of the image is calculated, and then the image is determined. The deflection rate of the galvanometer, the tester can know whether the deflection effect of the galvanometer is qualified according to the deflection rate, without the tester's naked eye observation, which improves the detection efficiency of the galvanometer, and the detection result is more accurate.
Description
technical field [0001] The present invention relates to the technical field of galvanometer deflection, in particular to a method, device, system and computer storage medium for measuring the deflection rate of a galvanometer. Background technique [0002] A digital light processing (DLP, Digital Light Processing) projection system includes a light-emitting component, a digital micromirror device (DMD, Digital Micromirror Device), a galvanometer, and other optical components and structural components. Among them, the galvanometer is used to increase the resolution of the image, and to improve the clarity of the image while miniaturizing the product. [0003] When the projector leaves the factory, the deflection effect of the galvanometer needs to be detected to ensure the high-definition image of the projector during projection. The deflection effect of the galvanometer is generally observed by the tester with the naked eye of the projected image, and the deflection effect ...
Claims
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IPC IPC(8): H04N9/31
CPCH04N9/3191
Inventor 庞凤颖
Owner GOERTEK OPTICAL TECH CO LTD