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Fault positioning self-test system and method

A fault location and self-testing technology, applied in testing/monitoring control systems, general control systems, electrical testing/monitoring, etc., can solve problems such as locating faults and inability to move, and achieve good automation and meet the effect of fault feature extraction

Inactive Publication Date: 2021-01-26
BEIJING INST OF ELECTRONICS SYST ENG
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] An object of the present invention is to provide a self-test system for fault location, which solves the problem that the previous test system cannot be moved and faults are located

Method used

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  • Fault positioning self-test system and method
  • Fault positioning self-test system and method

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Embodiment Construction

[0047] In order to enable those skilled in the art to better understand the solution of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. Apparently, the described embodiments are only some of the embodiments of the present invention, but not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0048] It should be noted that in this article, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is a relationship between these entities or operations. There is no such actual relationship or order between them. Furthermore, the term "comprises", "comprises" or any other variatio...

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Abstract

The invention discloses a fault positioning self-test system and method, and the system comprises an optical coupling isolation circuit, a PXI case, an analysis unit, a signal conditioner, a digital signal buffer, an upper computer, and a microprocessor. The PXI case comprises a PXI case back plate. A self-excitation response module, a three-purpose meter module, a communication module, a power calculation module, a sampling holding circuit and an AD module are inserted into the PXI case backboard, and the analysis unit comprises a voltage and current analysis module, a digital signal analysismodule, a power analysis module and a waveform analysis module. Compared with an existing test system, the fault positioning and portable functions are added in the test system, the existing test system is improved into a portable device of the BIT technology, and therefore fault feature extraction, knowledge base establishment and achievement of portable office equipment are met. In addition, the system has good automation, universalization and intelligentization application, and can be popularized and used in batches by referring to the design thought.

Description

technical field [0001] The invention relates to the technical field of testing. More specifically, it relates to a fault location self-test system and method based on BIT technology. Background technique [0002] The test system is an inspection tool for the quality of electronic products, and can provide regular maintenance for products to ensure their stable and reliable operation. With the increase of test complexity and test difficulty, the level and consumption of on-site test personnel are also increasing day by day. In order to get rid of on-site constraints, an automated, intelligent, and safe test data analysis and fault diagnosis system is an urgent need. [0003] BIT (built-in-test) technology, also known as built-in test technology or built-in self-test technology. As a means of system and equipment fault detection, location and isolation, it is a very important self-test method for some airborne equipment. It mainly aims at its system failure, and improves t...

Claims

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Application Information

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IPC IPC(8): G05B23/02
CPCG05B23/0213
Inventor 苏东泽信朝阳乔道鹏
Owner BEIJING INST OF ELECTRONICS SYST ENG
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