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Camera and Projector Adjustment Method for Profile Measurement

A profile measurement and projector technology, which is applied to measurement devices, instruments, optical devices, etc., can solve the problems of increasing the complexity of the algorithm for seeking height, and there is no systematic method, and achieves wide practicability, low cost, and adjustment methods. simple effect

Active Publication Date: 2022-05-10
SOUTHEAST UNIV
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Problems solved by technology

The above three constraints are relatively difficult to achieve. Research at home and abroad is basically improving the system principle to reduce constraints, such as making the line connecting the optical center of the camera and the optical center of the projector not parallel to the reference plane, or making the optical axis of the camera not perpendicular to the Reference surface, although these simplifies the system constraints, but introduces other variables that need to be measured, which increases the complexity of the algorithm for height calculation, and how to adjust the camera and projector to achieve the constraints of contour measurement based on projection. There is no systematic approach to

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  • Camera and Projector Adjustment Method for Profile Measurement
  • Camera and Projector Adjustment Method for Profile Measurement
  • Camera and Projector Adjustment Method for Profile Measurement

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[0026] The technical solution of the present disclosure will be described in detail below in conjunction with the accompanying drawings. In the description of the present disclosure, it should be understood that the terms "first", "second", and "third" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly indicating the indicated The number of technical characteristics is only used to distinguish different components. The “photograph of the first calibration plate” described in this disclosure refers to a group of photos taken continuously by the camera to the calibration plate during the translation process of the origin of the calibration plate along the front and rear directions of the camera. Therefore, the “first translation vector” includes is also all the translation vectors of a group of photos, and the "first Z component" refers to all the Z components of a group of photos, so that the camera is a...

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Abstract

The invention discloses an adjustment method for a camera and a projector used for profile measurement, relates to the technical fields of optical measurement and mechanical engineering, and solves the technical problem that it is difficult to meet constraints when performing profile measurement based on fringe projection. The main points of the technical solution The positions of the camera and the projector are determined by the three constraints of the verticality of the camera, the line connecting the optical center of the camera and the optical center of the projector parallel to the reference plane, and the comparison between the optical axis of the camera and the optical axis of the projector and a point on the reference plane. Adjustment, so as to realize the above three constraints, the adjustment method is simple, low cost and widely practicable.

Description

technical field [0001] The present disclosure relates to the technical fields of optical measurement and mechanical engineering, and in particular to a method for adjusting a camera and a projector used for contour measurement. Background technique [0002] The fringe projection three-dimensional measurement technology is an active optical measurement technology. This method projects a fringe pattern on the measured object, and at the same time uses a camera or other optical data collector to obtain the modulated fringe image. After the fringe information, calculate the surface height of the object, such as figure 1 shown. The development of fringe projection three-dimensional measurement technology is relatively fast, and now it has produced many branches, including: phase measurement profilometry (also known as phase shift measurement profilometry), Fourier transform profilometry and color-coded fringe projection method. Phase-shift measurement profilometry and Fourier t...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/25
CPCG01B11/254
Inventor 罗晨徐超周怡君
Owner SOUTHEAST UNIV