High-low bias test device and method and computer readable storage medium of device

Abstract

The invention provides a high-low bias test device and method and a computer readable storage medium of the device, belongs to the technical field of computer testing, and solves the technical problems that: in the existing research and development testing process, a large number of experimental verification needs to be carried out, damage is easily caused, the workload is large, the debugging process is complex and variable, and the working efficiency is seriously lowered. The high-low bias test device comprises a storage server, a first drive card, a second drive card, a flash disk frame, adial switch and an FPGA; each of the first drive card and the second drive card comprises a PCIE adjusting chip arranged on the receiving path, and PCIE parameters of the PCIE adjusting chip are adjustable; the first driving card and the second driving card are respectively connected with a dial switch through an FPGA. and the FPGA reads setting information bit and parameter information bit of thedial switch, and the FPGA adjusts the PCIE parameters of the PCIE adjusting chip according to the parameter value of the parameter information bit.

Description

technical field [0001] The present invention relates to the technical field of computer testing, in particular to a deflection testing device, method and computer-readable storage medium thereof. Background technique [0002] With the significant increase in the application of domestic artificial intelligence and big data technology, the continuous improvement of the informatization level of the whole society, and the continuous advancement of "Internet +", China's information storage demand and computing power demand have increased significantly. It is expected that the Chinese server market in the next few years will still maintain a high growth rate. [0003] In order to adapt to the high-capacity storage environment, the storage server is generally used as the head in the general storage construction environment. For the PCIE link, the external PCIE cable is generally connected to the JBOF as the expansion cabinet. Due to on-site environmental factors, the length of the...

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Problems solved by technology

[0006] The object of the present invention is to provide a pull-off test device, method and computer-readable storage medium thereof, so as to solve the problem that a large number of experiments need to be carried out in the existing research and development test process Verification, if the circuit board is continuously soldered to achieve the purpose of burning configuration and optimizing parameters, it is easy to cause damage, and the workload is large, the debugging process is complicated and changeable, it is very inconvenient to operate, and the technology that seriously reduces the work efficiency question

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