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On-line measurement method for micro-waviness of advanced glass substrate

A technology of glass substrates and measurement methods, which is applied in the direction of measurement devices, preparation of test samples, and material analysis through optical means. It can solve the problems of not being able to sample too much glass, long testing time, and unknown micro-waviness of the entire board, etc. problem, to achieve the effect of sample improvement, precision and accuracy, and high efficiency

Pending Publication Date: 2021-02-05
BENGBU CHINA OPTOELECTRONIC TECH CO LTD
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The probe scanning method is used to detect the micro-waviness during sampling test. The test sample is not larger than 50cmx50cm, and the scanning length is ≤20cm. It can only measure the flatness of a small section, and the micro-waviness of the whole board cannot be known.
[0006] 3. The sampling test process requires destructive experiments on the glass, so that too much glass cannot be sampled.
[0007] 4. The sampling test uses the probe scanning method to detect the micro-waviness. The test takes a long time. When the test results come out, many defective products may have been produced.

Method used

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  • On-line measurement method for micro-waviness of advanced glass substrate

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Embodiment Construction

[0019] Such as figure 1 As shown, the present invention provides an online measurement method for the microwaviness of a high-generation glass substrate, comprising the following steps:

[0020] a. Along the float flow direction of the glass substrate 1, divide and mark the glass substrate into a group of sampling rectangular blocks 2, and the sampling rectangular blocks 2 are distributed in a rectangular array; the sampling rectangular blocks 2 completely separate and mark the entire glass substrate;

[0021] The size of the sampling rectangular block 2 can be adjusted according to the size of the glass substrate, and the size of the sampling rectangular block can also be inconsistent, as long as the entire glass plate is fully separated and marked;

[0022] B, the central line of each sampling rectangular block is used as the sampling line 3, and the sampling line 3 is perpendicular to the flow direction of the float;

[0023] Each sampling line is defined by the coordinate...

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Abstract

The invention discloses an on-line measurement method for the micro-waviness of an advanced glass substrate. The method comprises the following steps of: a, enabling the glass substrate to be dividedand marked into a group of sampling rectangular blocks along the float flow direction of the glass substrate, and enabling the sampling rectangular blocks to be distributed in a rectangular array; b,taking the central line of each sampling rectangular block as a sampling line, the sampling line being vertical to the float flow direction; c, scanning all the sampling lines of the glass substrate by adopting an optical micro-waviness inspection machine, the micro-waviness of each sampling line representing the micro-waviness of the corresponding sampling rectangular block; and d, calculating the average value of the micro-waviness of all the sampling rectangular blocks, wherein the average value is used as the average value of the micro-waviness of the glass substrate, the maximum micro-waviness in all the sampling rectangular blocks is used as the maximum micro-waviness of the glass substrate, and the minimum micro-waviness in all the sampling rectangular blocks is used as the minimummicro-waviness of the glass substrate. According to the method, the micro-waviness of the glass substrate can be comprehensively measured in an online and lossless manner, the measurement efficiency is high, and the accuracy is high.

Description

technical field [0001] The invention relates to the technical field of glass substrate detection, in particular to an online measurement method for micro-waviness of high-generation glass substrates. Background technique [0002] The glass substrate produced by the float process has micro-waviness perpendicular to the float direction. During the glass manufacturing process, the micro-waviness needs to be detected for classification. After the glass surface is processed, the micro-waviness needs to be detected to verify the surface processing quality. Existing methods generally take a glass ribbon perpendicular to the flow direction of the float glass to sample and measure the micro-waviness and roughness. Use the probe instrument to scan the centerline of the sampled glass ribbon to obtain the micro-waviness value on a line perpendicular to the flow direction of the float. Due to the limitation of the scanning length of the probe instrument, the glass ribbon is usually cut ...

Claims

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Application Information

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IPC IPC(8): G01N21/958G01N21/01G01N1/28
CPCG01N21/958G01N21/01G01N1/28
Inventor 朱永迁张冲侯建伟曹志强权立振朱猛
Owner BENGBU CHINA OPTOELECTRONIC TECH CO LTD
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