Paper tube defect detection method and device, electronic equipment and storage medium
A defect detection and defect technology, applied in the field of image processing, can solve problems such as poor accuracy, achieve the effect of improving accuracy, reducing complexity, and avoiding blurred classification
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Embodiment 1
[0049] figure 1 The schematic diagram of the paper tube defect detection process provided by the embodiment of the present invention includes the following process:
[0050] S101: Acquiring a side image and a top image of the paper tube.
[0051]S102: Input the side image into the pre-trained first detection model, perform defect detection on the side image based on the first detection model, and output the first defect area and the first defect category in the side image .
[0052] S103: Input the top image into the pre-trained second detection model, perform defect detection on the top image based on the second detection model, and output the second defect area and the second defect area in the top image. defect category.
[0053] The paper tube defect detection method provided by the embodiment of the present invention is applied to an electronic device, and the electronic device may be a PC, a tablet computer, or the like.
[0054] The side image and the top image of t...
Embodiment 2
[0058] Because paper tube defects intersect in space, in the above embodiment, after the first defect area is determined based on the first detection model, and the second defect area is determined based on the second detection model, the same type of defect area will appear In the case of multiple detection frames, the detection result is very unattractive. In order to make the detection result more intuitive and clear, in the embodiment of the present invention, the method further includes:
[0059] A preset algorithm is used to perform fusion processing on the first defect regions with intersections of the same category and the second defect regions with intersections of the same category respectively.
[0060] In the embodiment of the present invention, defect detection is performed on the side image based on the first detection model, and after outputting the first defect area and the first defect category in the side image, the first defect area is divided according to di...
Embodiment 3
[0063] On the basis of the above-mentioned embodiments, in the embodiment of the present invention, the detection model sequentially includes a residual network structure, a positioning layer and a classification layer;
[0064] Defect detection is performed on the image based on the detection model, and the defect areas and defect categories in the output image include:
[0065] Based on the residual network structure, the image is convolved to obtain a feature image; based on the positioning layer, the position information of the defect area in the feature image is determined; based on the classification layer, it is determined that the defect area corresponds to category of defects.
[0066] The first detection model and the second detection model in the embodiment of the present invention have the same structure, including a residual network structure, a positioning layer and a classification layer. The difference between the first detection model and the second detection ...
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