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Test device and test system

A test equipment and test system technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of inability to accurately locate and inability to detect receiving cards independently

Pending Publication Date: 2021-02-26
XIAN NOVASTAR TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, the signal source output device can only output the signal source to the sending card, and cannot detect the receiving card alone. At the same time, the signal source is output to the sending card and then transmitted to the receiving card, and it is impossible to accurately locate the problem of the sending card or the receiving card.

Method used

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  • Test device and test system

Examples

Experimental program
Comparison scheme
Effect test

no. 1 example

[0033] see figure 1 A test system provided by the first embodiment of the present invention includes: a test device 100 and a plurality of receiving cards 200, and the plurality of receiving cards 200 are serially connected to the test device 100 (or cascaded).

[0034] Such as figure 2 As shown, the test device 100 includes, for example, an embedded processor 110 , a sending card circuit 120 and a receiving card test interface 130 . The sending card circuit 120 is connected to the embedded processor 110 , and the receiving card test interface 130 is connected to the sending card circuit 120 . Embedded processor 110 is such as ARM (Advanced RISC Machines) processor, and it has characteristics such as volume is small, low power consumption, low cost, high performance, can control test equipment work; Receiving card test interface 130 is such as Ethernet interface, Optical fiber interface, coaxial cable interface, but this embodiment of the present invention is not limited th...

no. 2 example

[0043] see Figure 8 , a test system provided by the second embodiment of the present invention includes: a test device 100 and a receiving card 200 , wherein the receiving card 200 includes a first data interface 202 and a second data interface 204 . The first data interface 202 and the second data interface 204 are, for example, Ethernet interfaces, optical fiber interfaces, coaxial cable interfaces, and the like.

[0044] Such as Figure 9 as shown, Figure 8 The test equipment 100 shown in includes: an embedded processor 110, a microprocessor 121, a programmable logic device 122, a first nonvolatile memory 122, a first receiving card test interface 132 and a second receiving card test interface 134 , the microprocessor 121 is connected to the embedded processor 110, the programmable logic device 122 is connected to the microprocessor 110 and the embedded processor 110, the first non-volatile memory 123 is connected to the microprocessor 121 and the programmable logic dev...

no. 3 example

[0048] see Figure 10 A test system provided by the third embodiment of the present invention includes: a test device 100, a sending card 400, a receiving card 200 and an LED display 300, the sending card 400 is connected to the testing device 100, the receiving card 200 is connected to the sending card 400, and the LED display The screen 300 is connected to the receiving card 200.

[0049] Such as Figure 11 As shown, the test equipment 100 includes: an embedded processor 110, a microprocessor 121, a programmable logic device 122, a first non-volatile memory 122, a receiving card test interface 130, an output selection circuit 170 and a sending card test interface 180 , the microprocessor 121 is connected to the embedded processor 110, the programmable logic device 122 is connected to the microprocessor 110 and the embedded processor 110, the first non-volatile memory 123 is connected to the microprocessor 121 and the programmable logic device 122, receiving The card test i...

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Abstract

The embodiment of the invention provides a test variation and a test system. The test device comprises an embedded processor; a sending card circuit electrically connected with the embedded processor;and a receiving card test interface electrically connected with the sending card circuit. According to the embodiment of the invention, the embedded processor is connected with the sending card circuit and the receiving card test interface, so that the test device can be directly connected with a receiving card, and a signal source is sent to the receiving card through the test device to be displayed by an LED display screen, thereby realizing detection of the receiving card.

Description

technical field [0001] The invention relates to the technical field of display control, in particular to a testing device and a testing system. Background technique [0002] When building a large LED display, it is usually spliced ​​by multiple cabinets one by one. After the construction is completed, the LED display is tested to test whether the splicing of the LED display is normal, whether the receiving card and the cabinet are working normally . In the prior art, the signal source output device is used to connect the receiving card and the LED display through the sending card, and the signal source output device can output a simple signal source to the sending card to make the LED display display a test picture. However, the signal source output device can only output the signal source to the sending card, and cannot detect the receiving card alone. At the same time, the signal source is output to the sending card and then transmitted to the receiving card, and it is im...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
CPCG01R31/00
Inventor 陈永军杜长磊韦桂锋
Owner XIAN NOVASTAR TECH