PCIE card asynchronous high-performance test method and system

Abstract

The invention provides a PCIE card asynchronous high-performance test method and system. The method comprises the steps that a PCIE card is inserted into a test host through a physical interface, wherein the PCIE card comprises n DMA high-speed channels, q BAR low-speed channels and a configuration space; the test host starts a PCIE card configuration space monitoring thread; the test host startsn DMA test thread groups based on the number n of the DMA high-speed channels, and starts q BAR test thread groups based on the number q of the BAR low-speed channels; the data processing accuracy ofeach DMA high-speed channel is asynchronously tested through n DMA test thread groups, and asynchronously testing the data processing accuracy of each BAR low-speed channel through q BAR test thread groups; and in the n DMA test thread groups and the q BAR test thread groups, if a test thread group exceeding a preset threshold feeds back a data processing error of the DMA high-speed channel or theBAR low-speed channel, a fact that the data processing performance of the PCIE card is unqualified is judged, and otherwise, a fact that the data processing performance of the PCIE card is qualifiedis judged.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a PCIE card asynchronous high-performance testing method and system. Background technique [0002] At present, many hardware devices (such as PCIE cards) need to be tested for performance after the development is completed. Since PCIE cards are usually equipped with multiple DMA high-speed channels and BAR low-speed channels, when testing the performance of PCIE cards, not only the limit speed of a single DMA channel, but also multiple DMA high-speed channels and multiple BARs need to be considered. Stability under the low-speed channel parallel mixed scene, yet traditional test methods (such as the disclosed PCIe card test device and method thereof of CN 110837445 A) seldom take into account the above-mentioned aspects of the test content. In view of this, it is urgent to provide a A more reasonable and comprehensive test framework to meet the test requirements of PCIE cards. ...

AI Technical Summary

Problems solved by technology

[0003] Aiming at the problem of single test content in the traditional PCIE card test method, the present invention provides a PCIE card asynchronous high-performance test method and system

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