A method and device for locating open-circuit faults of sub-modules of mmc converters
An open-circuit fault and locating method technology, applied in the direction of continuity testing, etc., can solve the problems of low locating efficiency, long execution period, cumbersome locating method and process, etc.
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[0048] The embodiment of the present application provides a method and device for locating open-circuit faults of MMC converter sub-modules, which are used to solve the technical problems of low locating efficiency caused by the cumbersome process and long execution period of the existing open-circuit fault locating methods.
[0049] In order to make the purpose, features and advantages of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. Obviously, the following The described embodiments are only some of the embodiments of the present application, but not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
[0050...
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