A method and system for batch testing usb electronic disks

A batch testing, electronic disk technology, applied in static memory, instruments, etc., can solve problems such as low efficiency and long time consumption, and achieve the effect of reducing test time, labor cost and time cost, and improving batch testing efficiency.

Active Publication Date: 2021-07-23
AXD (ANXINDA) MEMORY TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

However, the existing test methods for USB DOM electronic disks are inefficient and time-consuming

Method used

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  • A method and system for batch testing usb electronic disks
  • A method and system for batch testing usb electronic disks
  • A method and system for batch testing usb electronic disks

Examples

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Embodiment Construction

[0051] The exemplary embodiment will be described in detail herein, and examples thereof are shown in the drawings. The following description is related to the drawings, unless otherwise indicated, the same numbers in the drawings represent the same or similar elements. The embodiments described in the exemplary embodiments are not meant to all embodiments consistent with the present application. In contrast, examples of apparatus and methods consistent with some aspects of the present application are intended in detailed in the appended claims.

[0052] First see figure 1 It is a schematic diagram of a method of mass testing a USB electronic disk according to the present disclosure, which can be applied to a computer device, the computer device and a fan-free flight control communication. Further, the method can include the content described in step S11 - Step S13.

[0053] Step S11, when the insertion signal of the USB electronic disk to be tested is detected, the plurality of p...

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Abstract

The present disclosure can realize batch testing of multiple USB electronic disks to be tested, can perform read and write tests on multiple USB electronic disks to be tested through the target test program, and obtain the read and write test results corresponding to each USB electronic disk to be tested, and then Identify each read-write test result, and output the first visualization result corresponding to the first USB electronic disk when the read-write test result indicates that its corresponding first USB electronic disk has passed the test. When the read / write test result indicates that the corresponding second USB electronic disk fails the test, a second visualization result corresponding to the second USB electronic disk is output. Such a design can realize batch automated testing of USB electronic disks to be tested, thereby improving batch testing efficiency for USB electronic disks, reducing test time consumption, and further reducing labor costs and time costs for testing.

Description

Technical field [0001] The present disclosure relates to the field of USB DOM electronic disk test technology, and in particular, a method and system for mass testing USB electronic trays. Background technique [0002] In the storage industry, the quality of storage devices is subject to customer attention. In the prior art, the H2TEST software is used to test a hard drive can only test a USB DOM electronic disk and cannot meet a large amount of production demand. In the prior art, the H2Test software cannot achieve a unified multiple USB DOM electronic disk simultaneously; when you use the H2Test software to test the hard disk, you need to manually choose the test target, then click Run to start, you can't implement automation and unable one-click operation. Improve productivity, a computer test a disk and the desktop shows a window, which is very efficient during large quantities of production, improves labor cost and time cost. Therefore, the issue of mass rapid testing of USB...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 李修录尹善腾朱小聪吴健全
Owner AXD (ANXINDA) MEMORY TECH CO LTD
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