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Two-dimensional flicker measurement device

A measuring device and a technology to be measured, which are applied in measuring devices, identification devices, measuring circuits, etc., can solve the problems of reduced accuracy of flicker measurement, poor reproducibility of variable data, high noise, etc.

Active Publication Date: 2021-04-30
KONICA MINOLTA INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] However, a two-dimensional sensor capable of high-speed operation is expensive
In addition, the 2D sensor capable of high-speed operation needs to process the analog image data before AD conversion at high speed compared with the general 2D sensor, so the noise becomes higher.
Therefore, the reproducibility of the acquired pixel value fluctuation data is not good, so the measurement accuracy of flicker is lowered.

Method used

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Examples

Experimental program
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Effect test

no. 1 approach

[0033] figure 1 It is a block diagram schematically showing an example of the electrical configuration of the two-dimensional scintillation measurement device of the first embodiment. figure 2 It is a side view schematically showing the measurement state of the two-dimensional scintillation measurement device.

[0034] Such as figure 2 As shown, the two-dimensional flicker measurement device 100 two-dimensionally measures the flicker generated on the display screen of the object 5 to be measured. The measured object 5 is, for example, a device having a display screen such as a liquid crystal display. Such as figure 1 , figure 2 As shown, the two-dimensional scintillation measurement device 100 of the first embodiment includes lenses 10 , 15 , two-dimensional sensors 105 , 110 , a distance sensor 115 , an input unit 120 , and a control circuit 130 . The control circuit 130 includes a memory 140, a central processing unit (CPU) 150, and peripheral circuits (not shown). ...

no. 2 approach

[0076] Figure 9 It is a block diagram schematically showing an example of the electrical configuration of the two-dimensional scintillation measurement device 200 of the second embodiment. The two-dimensional scintillation measurement device 200 of the second embodiment includes a two-dimensional scintillation measurement camera 100A and a personal computer (PC) 210 .

[0077] The two-dimensional scintillation measurement camera 100A has the same configuration as the two-dimensional scintillation measurement device 100 of the first embodiment except that a control circuit 130A is provided instead of the control circuit 130 . That is, the two-dimensional scintillation measurement camera 100A includes lenses 10, 15 ( figure 2 ), two-dimensional sensors 105, 110, distance sensor 115, input unit 120, and control circuit 130A. Control circuit 130A includes memory 140A, CPU 150A, communication interface (communication IF) 160, and peripheral circuits (not shown).

[0078] The m...

no. 3 approach

[0084] Figure 10 It is a side view schematically showing the measurement state of the two-dimensional flicker measurement device 100B of the third embodiment. Figure 11 It is a diagram schematically showing the field of view of the two-dimensional sensor and a partial imaging area.

[0085] The two-dimensional scintillation measurement device 100B of the third embodiment has the same configuration as the two-dimensional scintillation measurement device 100 of the first embodiment except that a half mirror 25 is provided instead of the lens 15 . That is, the two-dimensional scintillation measurement device 100B of the third embodiment includes a lens 10, a half mirror 25, two-dimensional sensors 105, 110, and a distance sensor 115 ( figure 1 ), input unit 120 ( figure 1 ) and the control circuit 130.

[0086] The half mirror 25 (corresponding to an example of an optical component) splits the light from the object to be measured 5 into light toward the two-dimensional senso...

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Abstract

A two-dimensional flicker measurement device according to the present application is provided with a plurality of two-dimensional sensors having a partial readout function for reading out only pixel values of a part of photoelectric conversion elements included in a set partial readout region among a plurality of photoelectric conversion elements. The two-dimensional flicker measurement device sets a plurality of measurement regions two-dimensionally on an object to be measured, and sets a plurality of partial readout regions of a plurality of partial readout regions of a plurality of two-dimensional sensors in each of a plurality of partial imaging regions obtained by dividing an entire imaging region including the entire object to be measured. Each of the pixel values in the plurality of measurement regions is acquired, and the flicker values of the plurality of measurement regions are determined on the basis of each of the pixel values in the plurality of measurement regions.

Description

technical field [0001] The present invention relates to a two-dimensional flicker measurement device for two-dimensionally measuring flicker generated on a display screen of a display device. Background technique [0002] Conventionally, a dot-type flicker measuring device is known as a measuring device for measuring flicker generated on a display screen of a display device. The point-type flicker measurement device measures flicker by detecting fluctuations in output pixel values ​​in a predetermined measurement area (hereinafter also referred to as “measurement point”) of the object to be measured. In order to detect fluctuations in pixel values ​​output from a display screen, it is necessary to detect pixel values ​​at a sampling rate sufficiently higher than the pulsation frequency of interest. Flicker measurement accuracy depends on the sampling rate at which pixel values ​​are detected. The higher the sampling rate, the more accurate the flicker measurement will be. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01M11/00G01J1/44
CPCG01M11/00G01J2001/4247G01J1/36G01J1/42G01J1/44G02F1/13G09F9/00G09G3/006H04N23/00H04N23/745G01J11/00
Inventor 增田敏
Owner KONICA MINOLTA INC
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