System and method for testing large signal index of amplitude limiter chip

Abstract

The invention relates to the field of amplitude limiter chip testing, in particular to a sstem and method for testing a large signal index of an amplitude limiter chip. The system comprises a signal source, a power amplifier, an isolator, a coupler, a power source modulator and a direct current source; the power amplifier, the isolator, and the coupler are successively connected; and the power source modulator and the direct current source are successively connected with the power amplifier. Besides, the system also includes a first attenuator, a second attenuator and a circulator that are respectively connected with the coupler, the first attenuator is connected with a first power meter, the second attenuator is connected with a first load, the circulator is connected with a second load; and the system also includes an amplitude limiter chip testing device, a third attenuator and a second power meter that are sequentially connected with the circulator. The system is convenient to install, uniform in interface and easy to use, solves the problem that the connection of the amplitude limiter chip is difficult and the test cannot be carried out, and can enable the test of the large signal index of the amplitude limiter chip to be carried out smoothly.

Description

technical field [0001] The invention belongs to the field of limiter chip testing, in particular to a testing system and method for a large signal index of a limiter chip. Background technique [0002] Limiter indicators include small signal indicators and large signal indicators. The small-signal index test method is relatively simple and accurate, and the limiter can be tested by microwave probe station and vector network analyzer, while the test of large-signal index is more complicated, and it is easy to cause errors in test results. [0003] The characteristics of the test of the large signal index of the limiter chip are: many test instruments, many adapters, and complicated connections. The traditional limiter chip large-signal test scheme directly connects the limiter chip to the power amplifier for testing. This test method is not only complicated in steps, difficult to calibrate, but also has many problems: the signal of the power amplifier will be affected by the...

AI Technical Summary

Problems solved by technology

The small-signal index test method is relatively simple and accurate, and the limiter can be tested by microwave probe station and vector network analyzer, while the test of large-signal index is more complicated, and it is easy to cause errors in test results

[0003] The characteristics of the test of the large signal index of the limiter chip are: many test instruments, many adapters, complicated connections, etc.

The traditional limiter chip large-signal test scheme directly connects the limiter chip to the power amplifier for testing. This test method is not only complicated in steps, difficult to calibrate, but also has many problems: the signal of the power amplifier will be affected by the subsequent circuit. The actual output power of the power amplifier cannot be monitored in real time, and the power reflected by the limiter affects the signal transmission of the previous circuit. These problems greatly affect the accuracy of the large signal index test of the limiter chip

At the same time, the chip area of ​​the limiter is small, and the connection is difficult, which makes it very difficult to test the large signal index of the limiter chip.

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