Energy storage capacitor failure detection method based on test carrier plate
A detection method, a technology of a test method, which is applied in the directions of capacitance measurement, electricity measurement, and electric variable measurement, which can solve problems such as time-consuming, energy storage capacitance error, etc., and achieve the effect of ensuring the accuracy of the test
Pending Publication Date: 2021-05-28
SANDTEK SEMICON TECH (SHANGHAI) LTD
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Problems solved by technology
[0004] However, among these decoupling capacitors, the energy storage capacitor with a large capacitance will cause a problem: when it is necessary to test the static DC leakage current IDDQ index of the chip under test, the energy storage capacitor will bring obvious errors
This often takes a lot of time
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[0033] The present invention will be further described below according to the accompanying drawings.
[0034] Such as figure 1 As shown, in typical cases, the power pin of the chip under test will be connected to a test circuit called Device Power Supply (DPS) inside the automatic test machine.
[0035] DPS has both the function of constant voltage output and the function of clamping current. When the DPS starts to power on the chip under test, its output voltage will not jump from 0 to the target voltage Vdut, but will supply power to the chip under test with a constant clamp current I_clamp. At this time, the DPS works in the clamp I mode. , essentially a constant current mode. During this process, the voltage rises steadily as the chip under test and its decoupling capacitors are charged. When the voltage rises to the target value Vdut, the DPS switches to the ForceV mode, that is, the constant voltage mode, and the current will drop to the working current of the chip at...
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The invention relates to the technical field of semiconductor testing, and in particular relates to an energy storage capacitor failure detection method based on a test carrier plate. The specific test method comprises the steps of S1 connecting the test carrier plate with a DPS test circuit; S2 enabling the test carrier plate to be in a no-load state; S3 enabling the test carrier plate to start to run; S4 estimating a target capacitance value C of the energy storage capacitor; S5 reading a constant output voltage Vdut and a clamping current Iclamp; S6 calculating test time t; S7 setting working parameters of the DPS test circuit; S8 triggering a ForceV mode of the DPS test circuit; S9 calculating the capacitance value C actual measurement of the actual measurement energy storage capacitor; and S10 judging the failure condition of the energy storage capacitor according to the actually measured data of the capacitance value C of the energy storage capacitor. Compared with the prior art, the detection method has the advantages that the failure detection of the energy storage capacitor on the carrier circuit board can be realized by using the existing functions of an automatic test machine, the failure condition of the energy storage capacitor on the carrier circuit board can be accurately known and timely processed, and the test accuracy of an integrated circuit chip is ensured.
Description
technical field [0001] The invention relates to the technical field of semiconductor testing, in particular to an energy storage capacitor failure detection method based on a test carrier board. Background technique [0002] Generally, a stable power supply is required for the normal operation of an integrated circuit chip. Usually when designing a circuit, some decoupling capacitors will be placed near the power pins where the power pins of the chip are connected to the power supply network, including filter capacitors with small capacitance and energy storage capacitors with large capacitance. [0003] For chip testing applications, all the pins of the chip must be connected to the pins of the automatic tester one by one, and the automatic tester often has a long internal cable connection between the pins and the test circuit unit. Therefore, when the chip under test is loaded on the circuit board of the test carrier, for the chip, its power supply pin generally has no ch...
Claims
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Login to View More IPC IPC(8): G01R27/26G01R31/28
CPCG01R27/2605G01R31/281G01R31/2812
Inventor 魏津张经祥胡雪原
Owner SANDTEK SEMICON TECH (SHANGHAI) LTD